Analyst XRScantech Instruments
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JTAG MapsAltium
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Related Products
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About
Analyst XR is a specialized software developed by ScanTech Instruments for advanced C-scan corrosion mapping in non-destructive testing applications. It enables users to generate detailed 3D models of pipes or vessels by automatically stitching together multiple scans, facilitating comprehensive analysis and external viewing. The software features a user-friendly interface with a calibration wizard to guide users through accurate setup processes. Real-time data monitoring allows for immediate adjustments during inspections, optimizing data acquisition. Analyst XR includes a re-gating function that permits post-scan adjustments to eliminate interference, ensuring precise scan maps. Customizable reporting templates enable the creation of job-specific reports, incorporating elements such as scan data, screenshots, and text boxes. The software also performs automated B31G analysis on scan data, providing critical assessments of structural integrity.
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About
JTAG Maps™ is an intuitive Altium extension that allows engineers to quickly assess the test possibilities offered by the JTAG devices within their design. Until now engineers could often spend hours manually highlighting the boundary-scan nets of a design to determine test coverage. Boundary-scan device model files (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However JTAG Maps can work with or without BSDL models and includes an 'assume scan covered' option. While most users will want to simply use the coverage report that JTAG Maps for Altium can provide, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.
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Platforms Supported
Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook
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Platforms Supported
Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook
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Audience
Quality assurance engineers wanting a tool to optimize their corrosion mapping and analysis processes
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Audience
Engineers searching for a platform to quickly assess the capabilities of the JTAG devices on their design
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Support
Phone Support
24/7 Live Support
Online
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Support
Phone Support
24/7 Live Support
Online
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API
Offers API
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API
Offers API
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Screenshots and Videos |
Screenshots and Videos |
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Pricing
No information available.
Free Version
Free Trial
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Pricing
No information available.
Free Version
Free Trial
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Reviews/
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Reviews/
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Training
Documentation
Webinars
Live Online
In Person
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Training
Documentation
Webinars
Live Online
In Person
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Company InformationScantech Instruments
Founded: 1997
United States
scanndt.com/products/ndt-software/analyst-xr-software-for-c-scanning/
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Company InformationAltium
Founded: 1985
United States
www.altium.com/products/extensions/platform-extensions/jtag-maps/overview
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Categories |
Categories |
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Integrations
Allegro X Design Platform
OrCAD X
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