Analyst XR

Analyst XR

Scantech Instruments
JTAG Maps

JTAG Maps

Altium
+
+

Related Products

  • PostScan Mail
    137 Ratings
    Visit Website
  • Building Logistics
    186 Ratings
    Visit Website
  • BranditScan
    68 Ratings
    Visit Website
  • Aikido Security
    239 Ratings
    Visit Website
  • Rocket z/Assure VAP
    1 Rating
    Visit Website
  • ShareMyToolbox
    41 Ratings
    Visit Website
  • MyQ
    197 Ratings
    Visit Website
  • ESET PROTECT Advanced
    2,304 Ratings
    Visit Website
  • Gearset
    305 Ratings
    Visit Website
  • PackageX OCR Scanning
    48 Ratings
    Visit Website

About

Analyst XR is a specialized software developed by ScanTech Instruments for advanced C-scan corrosion mapping in non-destructive testing applications. It enables users to generate detailed 3D models of pipes or vessels by automatically stitching together multiple scans, facilitating comprehensive analysis and external viewing. The software features a user-friendly interface with a calibration wizard to guide users through accurate setup processes. Real-time data monitoring allows for immediate adjustments during inspections, optimizing data acquisition. Analyst XR includes a re-gating function that permits post-scan adjustments to eliminate interference, ensuring precise scan maps. Customizable reporting templates enable the creation of job-specific reports, incorporating elements such as scan data, screenshots, and text boxes. The software also performs automated B31G analysis on scan data, providing critical assessments of structural integrity.

About

JTAG Maps™ is an intuitive Altium extension that allows engineers to quickly assess the test possibilities offered by the JTAG devices within their design. Until now engineers could often spend hours manually highlighting the boundary-scan nets of a design to determine test coverage. Boundary-scan device model files (BSDLs) are pivotal to any JTAG/boundary-scan process as they indicate precisely which pins can be controlled or observed by JTAG/boundary-scan. However JTAG Maps can work with or without BSDL models and includes an 'assume scan covered' option. While most users will want to simply use the coverage report that JTAG Maps for Altium can provide, it is possible to import a more accurate picture. After exporting a JTAG ProVision project, the data can be sent for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.

Platforms Supported

Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook

Platforms Supported

Windows
Mac
Linux
Cloud
On-Premises
iPhone
iPad
Android
Chromebook

Audience

Quality assurance engineers wanting a tool to optimize their corrosion mapping and analysis processes

Audience

Engineers searching for a platform to quickly assess the capabilities of the JTAG devices on their design

Support

Phone Support
24/7 Live Support
Online

Support

Phone Support
24/7 Live Support
Online

API

Offers API

API

Offers API

Screenshots and Videos

Screenshots and Videos

Pricing

No information available.
Free Version
Free Trial

Pricing

No information available.
Free Version
Free Trial

Reviews/Ratings

Overall 0.0 / 5
ease 0.0 / 5
features 0.0 / 5
design 0.0 / 5
support 0.0 / 5

This software hasn't been reviewed yet. Be the first to provide a review:

Review this Software

Reviews/Ratings

Overall 0.0 / 5
ease 0.0 / 5
features 0.0 / 5
design 0.0 / 5
support 0.0 / 5

This software hasn't been reviewed yet. Be the first to provide a review:

Review this Software

Training

Documentation
Webinars
Live Online
In Person

Training

Documentation
Webinars
Live Online
In Person

Company Information

Scantech Instruments
Founded: 1997
United States
scanndt.com/products/ndt-software/analyst-xr-software-for-c-scanning/

Company Information

Altium
Founded: 1985
United States
www.altium.com/products/extensions/platform-extensions/jtag-maps/overview

Alternatives

Analyst NDX

Analyst NDX

Scantech Instruments

Alternatives

Analyst X

Analyst X

Scantech Instruments
InspectionBank

InspectionBank

Eclipse Scientific
STATUS 5

STATUS 5

Eclipse Scientific
Zertify

Zertify

Spinnsol

Categories

Categories

Integrations

Allegro X Design Platform
OrCAD X

Integrations

Allegro X Design Platform
OrCAD X
Claim Analyst XR and update features and information
Claim Analyst XR and update features and information
Claim JTAG Maps and update features and information
Claim JTAG Maps and update features and information