STATUS 5

Analyst X is a high-performance data analysis software developed by ScanTech Instruments, designed for B-scan ultrasonic inspections in non-destructive testing applications. It offers automated reporting capabilities, allowing users to generate scan plans and B-scans with a single click, and supports the overlay of multiple B-scans for detailed comparative analysis. The software can produce data tables displaying high, average, and low values for each scan, and includes a re-gating function that enables post-collection adjustment of scan data to create smooth, clean scan maps. Automated statistical analysis on scan data is also available. Analyst X features a user-friendly interface with guided calibration to assist users through the calibration process and supports automated data acquisition, adjustable gain modification before or during scans, real-time data monitoring with immediate adjustment capabilities, and seamless pausing and resuming of scans.

CIVA is a comprehensive simulation and analysis software designed specifically for Non-Destructive Testing (NDT) applications, offering advanced tools for Ultrasonic Testing (UT), Eddy Current Testing (ECT), and Radiographic Testing (RT). It provides powerful modeling capabilities to simulate inspection processes, enabling users to predict and analyze the performance of NDT methods in a virtual environment before conducting real-world inspections. CIVA helps optimize inspection techniques, reduce costs, and improve reliability by simulating defect detection, characterizing material properties, and visualizing inspection scenarios in detail. Its user-friendly interface and robust computational algorithms make it an essential tool for industries such as aerospace, energy, and manufacturing, where safety and precision are paramount. With CIVA, engineers can evaluate inspection parameters, enhance defect detection reliability, and ensure compliance with industry standards.