Audience
Enterprises and organizations looking for a solution to manage their inspections and data analysis operations
About Analyst X
Analyst X is a high-performance data analysis software developed by ScanTech Instruments, designed for B-scan ultrasonic inspections in non-destructive testing applications. It offers automated reporting capabilities, allowing users to generate scan plans and B-scans with a single click, and supports the overlay of multiple B-scans for detailed comparative analysis. The software can produce data tables displaying high, average, and low values for each scan, and includes a re-gating function that enables post-collection adjustment of scan data to create smooth, clean scan maps. Automated statistical analysis on scan data is also available. Analyst X features a user-friendly interface with guided calibration to assist users through the calibration process and supports automated data acquisition, adjustable gain modification before or during scans, real-time data monitoring with immediate adjustment capabilities, and seamless pausing and resuming of scans.
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