[Smartmontools-database] SAMSUNG SSD 830 Series - 64GB

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smartctl 5.41 2011-06-09 r3365 [i686-w64-mingw32-win7(64)-sp1] (sf-win32-5.41-1)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG SSD 830 Series
Serial Number:    S0VXNYABC02398
LU WWN Device Id: 5 002538 043584d30
Firmware Version: CXM03B1Q
User Capacity:    64 022 175 232 bytes [64,0 GB]
Sector Size:      512 bytes logical/physical
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ACS-2 revision 2
Local Time is:    Sat Feb 11 18:20:33 2012 
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  300) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (   5) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       16
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       14
177 Wear_Leveling_Count     0x0013   099   099   000    Pre-fail  Always       -       1
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   100   100   010    Pre-fail  Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0032   068   066   000    Old_age   Always       -       32
195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   099   099   000    Old_age   Always       -       5
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       84974556

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.