Can confirm: The segfault is a subsequent fault in fft because tran is not successful. Tried to decrease the thermal resistances but no luck.
Only an idea: You have v(fosc) in your write command and I assume it is a vector over the entire time duration. Try to separate these from your scalar results.
Diode sensitivity analysis: Exclude few parameters and add level 3 geometry parameter.
Fix the overlap in state vector for sensitivity states of diode and bjt model.
KLU bindings for separate sw diode only if sw resistor is given
Diode model level=2 (Fowler-Nordheim) is not supported.
diode discontinuity
Problem fixed by commit c1acc44 in pre-master-46.