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MaxFEM
Optoelectronics, actually. We're interested in better understanding the results of a 35 year old paper. The more I dig into it, the more it looks like we need a specialized semiconductor device simulator.
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MaxFEM
I'm guessing the answer is no because the 'electrostatics' application doesn't read conduction parameters and the 'DC conduction' applicaiton doesn't read dielectric parameters. Thanks in advance for any info on this topic
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