A simple GUI that allows the user to enter single and multiple site test times and calculate the parallel test efficiency and fully yielded per unit test cost.

Slider bars enable the user to experiment with different values of index time, uptime, yield and hourly cost to determine the test cost per device tested.

Save and load files as .csv for compatibility with excel

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Qt_ATE_PTE_Calc Screenshot 1

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Registered

2013-07-15
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