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[smartmontools-support]ICRC error
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From: Kaspar F. <fis...@in...> - 2006-04-02 15:21:57
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Hi all, What exactly is an ICRC (checksum error)? Is this checksum stored (say) per disk block and an error means that the the block is bad? Or is it rather that the communication between the disk and the OS has failed? I suppose it is the latter, right? (Because other posts on the list seem to indicate that "cabling" is the problem. I guess this means the cabling between the disk and the IDE card, right?) I am asking because I am facing this: smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: Maxtor 6Y120P0 Serial Number: Y3Q0BALE Firmware Version: YAR41BW0 Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sun Apr 2 17:19:33 2006 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 242) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 54) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 3 Spin_Up_Time 0x0027 204 204 063 Pre-fail Always - 4476 4 Start_Stop_Count 0x0032 253 253 000 Old_age Always - 22 5 Reallocated_Sector_Ct 0x0033 253 253 063 Pre-fail Always - 0 6 Read_Channel_Margin 0x0001 253 253 100 Pre-fail Offline - 0 7 Seek_Error_Rate 0x000a 253 252 000 Old_age Always - 0 8 Seek_Time_Performance 0x0027 251 249 187 Pre-fail Always - 51199 9 Power_On_Minutes 0x0032 247 247 000 Old_age Always - 1010h+21m 10 Spin_Retry_Count 0x002b 253 252 157 Pre-fail Always - 0 11 Calibration_Retry_Count 0x002b 253 252 223 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 253 253 000 Old_age Always - 37 192 Power-Off_Retract_Count 0x0032 253 253 000 Old_age Always - 0 193 Load_Cycle_Count 0x0032 253 253 000 Old_age Always - 0 194 Temperature_Celsius 0x0032 253 253 000 Old_age Always - 35 195 Hardware_ECC_Recovered 0x000a 253 252 000 Old_age Always - 1320 196 Reallocated_Event_Count 0x0008 253 253 000 Old_age Offline - 0 197 Current_Pending_Sector 0x0008 253 253 000 Old_age Offline - 0 198 Offline_Uncorrectable 0x0008 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0008 199 199 000 Old_age Offline - 1 200 Multi_Zone_Error_Rate 0x000a 253 252 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 252 000 Old_age Always - 3 202 TA_Increase_Count 0x000a 253 252 000 Old_age Always - 0 203 Run_Out_Cancel 0x000b 253 252 180 Pre-fail Always - 0 204 Shock_Count_Write_Opern 0x000a 253 252 000 Old_age Always - 0 205 Shock_Rate_Write_Opern 0x000a 253 252 000 Old_age Always - 0 207 Spin_High_Current 0x002a 253 252 000 Old_age Always - 0 208 Spin_Buzz 0x002a 253 252 000 Old_age Always - 0 209 Offline_Seek_Performnce 0x0024 196 187 000 Old_age Offline - 0 99 Unknown_Attribute 0x0004 253 253 000 Old_age Offline - 0 100 Unknown_Attribute 0x0004 253 253 000 Old_age Offline - 0 101 Unknown_Attribute 0x0004 253 253 000 Old_age Offline - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 1574 hours (65 days + 14 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 18 40 00 c8 e7 Error: ICRC, ABRT at LBA = 0x07c80040 = 130547776 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 00 18 40 00 c8 e7 08 35d+03:28:04.832 WRITE DMA ca 00 18 40 00 c4 e7 08 35d+03:28:04.832 WRITE DMA ca 00 08 40 00 c0 e7 08 35d+03:28:04.832 WRITE DMA ca 00 20 40 00 bc e7 08 35d+03:28:04.816 WRITE DMA ca 00 18 40 00 b8 e7 08 35d+03:28:04.816 WRITE DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime (hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 1952 - # 2 Extended offline Completed without error 00% 1617 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. Many thanks, Kaspar |
