I'm guessing the answer is no because the 'electrostatics' application doesn't read conduction parameters and the 'DC conduction' applicaiton doesn't read dielectric parameters.
Thanks in advance for any info on this topic
If you would like to refer to this comment somewhere else in this project, copy and paste the following link:
Optoelectronics, actually. We're interested in better understanding the results of a 35 year old paper. The more I dig into it, the more it looks like we need a specialized semiconductor device simulator.
If you would like to refer to this comment somewhere else in this project, copy and paste the following link:
I'm guessing the answer is no because the 'electrostatics' application doesn't read conduction parameters and the 'DC conduction' applicaiton doesn't read dielectric parameters.
Thanks in advance for any info on this topic
No, MaxFEM cannot handle lossy dielectrics. Just to know, are you thinking in microwave applications?
Optoelectronics, actually. We're interested in better understanding the results of a 35 year old paper. The more I dig into it, the more it looks like we need a specialized semiconductor device simulator.
Thank you for the information.