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Simulates basic reflectometer scans with X ray tracing.
With Virtual Reflectometer (VR), you can simulate the basic alignment scans of a basic X ray reflectometer (diffractometer) with a Goebel mirror using ray tracing.
With this program, you can characterize reflectometers and get a reflectometer-dependent overillumination correction for X Ray Reflectivity (XRR) scans.
The pogram serves as an educational tool for explaining alignment and for a proper overillumination correction of XRR data. !!
This toolkit allows complete control of a microscopy setup from Labview, Matlab, Scilab, Python, .Net, VB, IgorPro, Mathematica and more. Included is a standalone program for image acquisition and scripting control of a scientific microscope.