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Scanning probe microscopy data visualisation and analysis
A data visualization and processing tool for scanning probe microscopy (SPM, i.e. AFM, STM, MFM, SNOM/NSOM, ...) and profilometry data, useful also for general image and 2D data analysis.
Scanning Probe Microscopy Controller and Data Visualization Software
GXSM -- Gnome X Scanning Microscopy: A multi-channel image and vector-probe data acquisition and visualization system designed for SPM techniques (STM,AFM..), but also SPA-LEED/LEED/LEEM data analysis. A plug-in interface allows any user add-on data-processing and special hardware and instrument support. Latest: NC-AFM and related explorative methods as SQDM can be configured. High-Speed external PAC-PLL hardware option with digital DSP link.
Based on several hardware options it supports a commercially available DSP hardware and provided also Open Source Code for all the low level signal processing tasks and instrument controls in a most flexible and adaptable manner.
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Converter of various scalable font formats (most notably TTF) and of the bitmapped BDF
format into PostScript Type 1 fonts and metrics (.pfa, .pfb, .afm).