From: palacsint <pal...@fr...> - 2005-09-29 21:46:52
|
hi, I have an Offline_Uncorrectable error at sector 313962848 (see the log below), but this sector number is too big for my hdd. [20:14:07] kek:~# fdisk -lu /dev/hde Disk /dev/hde: 160.0 GB, 160041885696 bytes 255 heads, 63 sectors/track, 19457 cylinders, total 312581808 sectors Units = sectors of 1 * 512 = 512 bytes Device Boot Start End Blocks Id System /dev/hde1 * 63 112454 56196 fd Linux raid autodetect /dev/hde2 * 112455 32129999 16008772+ fd Linux raid autodetect /dev/hde3 32130000 34154189 1012095 fd Linux raid autodetect /dev/hde4 34154190 312576704 139211257+ 83 Linux It has only 312581808 sectors and there is a lots of messages in syslog like this: smartd[3225]: Device: /dev/hde, 1 Offline uncorrectable sectors How can I fix it? greets, miki [23:44:11] kek:~# smartctl -a /dev/hde smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP1614N Serial Number: S016J10Y327828 Firmware Version: TM100-30 Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Thu Sep 29 23:44:14 2005 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 25) The self-test routine was aborted by the host. Total time to complete Offline data collection: (6000) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 100) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5696 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 39 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 9791 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 481h+56m 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 1 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 23 194 Temperature_Celsius 0x0022 115 073 000 Old_age Always - 41 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 37752337 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 1 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 476 hours (19 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 51 00 03 4f c2 e0 Error: ABRT Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d4 00 03 4f c2 e0 00 00:18:40.000 SMART EXECUTE OFF-LINE IMMEDIATE b0 d1 01 01 4f c2 e0 00 00:18:40.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4] b0 d0 01 00 4f c2 e0 00 00:18:39.938 SMART READ DATA b0 da 00 00 4f c2 00 00 00:18:39.875 SMART RETURN STATUS b0 da 00 00 4f c2 e0 00 00:18:39.813 SMART RETURN STATUS SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Abort offline test Aborted by host 90% 480 - # 2 Extended offline Completed without error 00% 479 - # 3 Short offline Completed without error 00% 476 - # 4 Abort offline test Aborted by host 90% 476 - # 5 Short offline Completed without error 00% 474 - # 6 Short offline Completed without error 00% 463 - # 7 Short offline Completed without error 00% 460 - # 8 Extended offline Completed without error 00% 460 - # 9 Short offline Completed without error 00% 440 - #10 Short offline Completed without error 00% 418 - #11 Short offline Completed: read failure 00% 395 313962848 #12 Short offline Completed without error 00% 373 - #13 Extended offline Completed without error 00% 352 - #14 Short offline Completed without error 00% 350 - #15 Short offline Completed without error 00% 328 - #16 Short offline Completed without error 00% 305 - #17 Short offline Completed without error 00% 283 - #18 Short offline Completed without error 00% 260 - #19 Short offline Completed without error 00% 238 - #20 Short offline Completed without error 00% 215 - #21 Extended offline Completed without error 00% 195 - Device does not support Selective Self Tests/Logging |
From: Bruce A. <ba...@gr...> - 2005-09-29 22:23:41
|
Probably your disk has some 'reserved' sectors so it is reporting fewer sectors (160041885696/512 = 312581808) than it really has. See READ NATIVE MAX ADDRESS / SET MAX ADDRESS in http://www.linux.com/howtos/Large-Disk-HOWTO-11.shtml But it looks from the latest self-tests as if the uncorrectable sector is no longer present. Cheers, Bruce On Thu, 29 Sep 2005, palacsint wrote: > hi, > > I have an Offline_Uncorrectable error at sector 313962848 (see the log > below), but this sector number is too big for my hdd. > > [20:14:07] kek:~# fdisk -lu /dev/hde > > Disk /dev/hde: 160.0 GB, 160041885696 bytes > 255 heads, 63 sectors/track, 19457 cylinders, total 312581808 sectors > Units = sectors of 1 * 512 = 512 bytes > > Device Boot Start End Blocks Id System > /dev/hde1 * 63 112454 56196 fd Linux raid > autodetect > /dev/hde2 * 112455 32129999 16008772+ fd Linux raid > autodetect > /dev/hde3 32130000 34154189 1012095 fd Linux raid > autodetect > /dev/hde4 34154190 312576704 139211257+ 83 Linux > > > It has only 312581808 sectors and there is a lots of messages in syslog like > this: > > smartd[3225]: Device: /dev/hde, 1 Offline uncorrectable sectors > > How can I fix it? > > greets, > miki > > > [23:44:11] kek:~# smartctl -a /dev/hde > smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen > Home page is http://smartmontools.sourceforge.net/ > > === START OF INFORMATION SECTION === > Device Model: SAMSUNG SP1614N > Serial Number: S016J10Y327828 > Firmware Version: TM100-30 > Device is: In smartctl database [for details use: -P show] > ATA Version is: 7 > ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 > Local Time is: Thu Sep 29 23:44:14 2005 CEST > SMART support is: Available - device has SMART capability. > SMART support is: Enabled > > === START OF READ SMART DATA SECTION === > SMART overall-health self-assessment test result: PASSED > > General SMART Values: > Offline data collection status: (0x84) Offline data collection activity > was suspended by an interrupting > command from host. > Auto Offline Data Collection: > Enabled. > Self-test execution status: ( 25) The self-test routine was aborted by > the host. > Total time to complete Offline > data collection: (6000) seconds. > Offline data collection > capabilities: (0x1b) SMART execute Offline immediate. > Auto Offline data collection on/off > support. > Suspend Offline collection upon new > command. > Offline surface scan supported. > Self-test supported. > No Conveyance Self-test supported. > No Selective Self-test supported. > SMART capabilities: (0x0003) Saves SMART data before entering > power-saving mode. > Supports SMART auto save timer. > Error logging capability: (0x01) Error logging supported. > No General Purpose Logging support. > Short self-test routine > recommended polling time: ( 1) minutes. > Extended self-test routine > recommended polling time: ( 100) minutes. > > SMART Attributes Data Structure revision number: 16 > Vendor Specific SMART Attributes with Thresholds: > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED > WHEN_FAILED RAW_VALUE > 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always > - 0 > 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always > - 5696 > 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always > - 39 > 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always > - 0 > 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always > - 0 > 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline > - 9791 > 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always > - 481h+56m > 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always > - 0 > 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always > - 1 > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always > - 23 > 194 Temperature_Celsius 0x0022 115 073 000 Old_age Always > - 41 > 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always > - 37752337 > 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always > - 1 > 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always > - 0 > 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline > - 1 > 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always > - 0 > 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always > - 0 > 201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age Always > - 0 > > SMART Error Log Version: 1 > ATA Error Count: 1 > CR = Command Register [HEX] > FR = Features Register [HEX] > SC = Sector Count Register [HEX] > SN = Sector Number Register [HEX] > CL = Cylinder Low Register [HEX] > CH = Cylinder High Register [HEX] > DH = Device/Head Register [HEX] > DC = Device Command Register [HEX] > ER = Error register [HEX] > ST = Status register [HEX] > Powered_Up_Time is measured from power on, and printed as > DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, > SS=sec, and sss=millisec. It "wraps" after 49.710 days. > > Error 1 occurred at disk power-on lifetime: 476 hours (19 days + 20 hours) > When the command that caused the error occurred, the device was active or > idle. > > After command completion occurred, registers were: > ER ST SC SN CL CH DH > -- -- -- -- -- -- -- > 04 51 00 03 4f c2 e0 Error: ABRT > > Commands leading to the command that caused the error were: > CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name > -- -- -- -- -- -- -- -- ---------------- -------------------- > b0 d4 00 03 4f c2 e0 00 00:18:40.000 SMART EXECUTE OFF-LINE IMMEDIATE > b0 d1 01 01 4f c2 e0 00 00:18:40.000 SMART READ ATTRIBUTE THRESHOLDS > [OBS-4] > b0 d0 01 00 4f c2 e0 00 00:18:39.938 SMART READ DATA > b0 da 00 00 4f c2 00 00 00:18:39.875 SMART RETURN STATUS > b0 da 00 00 4f c2 e0 00 00:18:39.813 SMART RETURN STATUS > > SMART Self-test log structure revision number 1 > Num Test_Description Status Remaining LifeTime(hours) > LBA_of_first_error > # 1 Abort offline test Aborted by host 90% 480 - > # 2 Extended offline Completed without error 00% 479 - > # 3 Short offline Completed without error 00% 476 - > # 4 Abort offline test Aborted by host 90% 476 - > # 5 Short offline Completed without error 00% 474 - > # 6 Short offline Completed without error 00% 463 - > # 7 Short offline Completed without error 00% 460 - > # 8 Extended offline Completed without error 00% 460 - > # 9 Short offline Completed without error 00% 440 - > #10 Short offline Completed without error 00% 418 - > #11 Short offline Completed: read failure 00% 395 > 313962848 > #12 Short offline Completed without error 00% 373 - > #13 Extended offline Completed without error 00% 352 - > #14 Short offline Completed without error 00% 350 - > #15 Short offline Completed without error 00% 328 - > #16 Short offline Completed without error 00% 305 - > #17 Short offline Completed without error 00% 283 - > #18 Short offline Completed without error 00% 260 - > #19 Short offline Completed without error 00% 238 - > #20 Short offline Completed without error 00% 215 - > #21 Extended offline Completed without error 00% 195 - > > Device does not support Selective Self Tests/Logging > > > > > > > > ------------------------------------------------------- > This SF.Net email is sponsored by: > Power Architecture Resource Center: Free content, downloads, discussions, > and more. http://solutions.newsforge.com/ibmarch.tmpl > _______________________________________________ > Smartmontools-support mailing list > Sma...@li... > https://lists.sourceforge.net/lists/listinfo/smartmontools-support > |
From: palacsint <pal...@fr...> - 2005-09-30 07:45:51
|
hi, I download and compile the setmax.c, but I think its not work with my samsung hdd: [09:17:08] kek:~/src# ./setmax /dev/hde Using device /dev/hde native max address: 268435454 that is 137438952960 bytes, 137.4 GB lba capacity: 268435455 sectors (137438952960 bytes) I tried to boot with lilo and "hde=3Dstrike", but it has no effect. I found a hutil in http://www.samsung.com/Products/HardDiskDrive/utilities/hutil.htm but its also sux. "After performing SET MAX ADDRESS user=92s previous data will be corrupted. Therefore it takes into great consideration to back-up the data in advance. Samsung has no responsibility of lost data." Any idea? I would like to fix that Offline_Uncorrectable sector. greets, miki Bruce Allen wrote: > Probably your disk has some 'reserved' sectors so it is reporting fewer= =20 > sectors (160041885696/512 =3D 312581808) than it really has. >=20 > See READ NATIVE MAX ADDRESS / SET MAX ADDRESS in > http://www.linux.com/howtos/Large-Disk-HOWTO-11.shtml >=20 > But it looks from the latest self-tests as if the uncorrectable sector=20 > is no longer present. >=20 > Cheers, > Bruce >=20 >=20 > On Thu, 29 Sep 2005, palacsint wrote: >=20 >> hi, >> >> I have an Offline_Uncorrectable error at sector 313962848 (see the log >> below), but this sector number is too big for my hdd. >> >> [20:14:07] kek:~# fdisk -lu /dev/hde >> >> Disk /dev/hde: 160.0 GB, 160041885696 bytes >> 255 heads, 63 sectors/track, 19457 cylinders, total 312581808 sectors >> Units =3D sectors of 1 * 512 =3D 512 bytes >> >> Device Boot Start End Blocks Id System >> /dev/hde1 * 63 112454 56196 fd Linux raid >> autodetect >> /dev/hde2 * 112455 32129999 16008772+ fd Linux raid >> autodetect >> /dev/hde3 32130000 34154189 1012095 fd Linux raid >> autodetect >> /dev/hde4 34154190 312576704 139211257+ 83 Linux >> >> >> It has only 312581808 sectors and there is a lots of messages in=20 >> syslog like this: >> >> smartd[3225]: Device: /dev/hde, 1 Offline uncorrectable sectors >> >> How can I fix it? >> >> greets, >> miki >> >> >> [23:44:11] kek:~# smartctl -a /dev/hde >> smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen >> Home page is http://smartmontools.sourceforge.net/ >> >> =3D=3D=3D START OF INFORMATION SECTION =3D=3D=3D >> Device Model: SAMSUNG SP1614N >> Serial Number: S016J10Y327828 >> Firmware Version: TM100-30 >> Device is: In smartctl database [for details use: -P show] >> ATA Version is: 7 >> ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 >> Local Time is: Thu Sep 29 23:44:14 2005 CEST >> SMART support is: Available - device has SMART capability. >> SMART support is: Enabled >> >> =3D=3D=3D START OF READ SMART DATA SECTION =3D=3D=3D >> SMART overall-health self-assessment test result: PASSED >> >> General SMART Values: >> Offline data collection status: (0x84) Offline data collection activi= ty >> was suspended by an=20 >> interrupting command from host. >> Auto Offline Data Collection:=20 >> Enabled. >> Self-test execution status: ( 25) The self-test routine was=20 >> aborted by >> the host. >> Total time to complete Offline >> data collection: (6000) seconds. >> Offline data collection >> capabilities: (0x1b) SMART execute Offline immediat= e. >> Auto Offline data collection=20 >> on/off support. >> Suspend Offline collection upon= =20 >> new >> command. >> Offline surface scan supported. >> Self-test supported. >> No Conveyance Self-test support= ed. >> No Selective Self-test supporte= d. >> SMART capabilities: (0x0003) Saves SMART data before enteri= ng >> power-saving mode. >> Supports SMART auto save timer. >> Error logging capability: (0x01) Error logging supported. >> No General Purpose Logging=20 >> support. >> Short self-test routine >> recommended polling time: ( 1) minutes. >> Extended self-test routine >> recommended polling time: ( 100) minutes. >> >> SMART Attributes Data Structure revision number: 16 >> Vendor Specific SMART Attributes with Thresholds: >> ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED=20 >> WHEN_FAILED RAW_VALUE >> 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always= =20 >> - 0 >> 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always= =20 >> - 5696 >> 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always=20 >> - 39 >> 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always= =20 >> - 0 >> 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always= =20 >> - 0 >> 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail=20 >> Offline - 9791 >> 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always=20 >> - 481h+56m >> 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always= =20 >> - 0 >> 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always=20 >> - 1 >> 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always=20 >> - 23 >> 194 Temperature_Celsius 0x0022 115 073 000 Old_age =20 >> Always - 41 >> 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age =20 >> Always - 37752337 >> 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age =20 >> Always - 1 >> 197 Current_Pending_Sector 0x0012 100 100 000 Old_age =20 >> Always - 0 >> 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age=20 >> Offline - 1 >> 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age =20 >> Always - 0 >> 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age =20 >> Always - 0 >> 201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age =20 >> Always - 0 >> >> SMART Error Log Version: 1 >> ATA Error Count: 1 >> CR =3D Command Register [HEX] >> FR =3D Features Register [HEX] >> SC =3D Sector Count Register [HEX] >> SN =3D Sector Number Register [HEX] >> CL =3D Cylinder Low Register [HEX] >> CH =3D Cylinder High Register [HEX] >> DH =3D Device/Head Register [HEX] >> DC =3D Device Command Register [HEX] >> ER =3D Error register [HEX] >> ST =3D Status register [HEX] >> Powered_Up_Time is measured from power on, and printed as >> DDd+hh:mm:SS.sss where DD=3Ddays, hh=3Dhours, mm=3Dminutes, >> SS=3Dsec, and sss=3Dmillisec. It "wraps" after 49.710 days. >> >> Error 1 occurred at disk power-on lifetime: 476 hours (19 days + 20=20 >> hours) >> When the command that caused the error occurred, the device was=20 >> active or idle. >> >> After command completion occurred, registers were: >> ER ST SC SN CL CH DH >> -- -- -- -- -- -- -- >> 04 51 00 03 4f c2 e0 Error: ABRT >> >> Commands leading to the command that caused the error were: >> CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name >> -- -- -- -- -- -- -- -- ---------------- -------------------- >> b0 d4 00 03 4f c2 e0 00 00:18:40.000 SMART EXECUTE OFF-LINE=20 >> IMMEDIATE >> b0 d1 01 01 4f c2 e0 00 00:18:40.000 SMART READ ATTRIBUTE=20 >> THRESHOLDS [OBS-4] >> b0 d0 01 00 4f c2 e0 00 00:18:39.938 SMART READ DATA >> b0 da 00 00 4f c2 00 00 00:18:39.875 SMART RETURN STATUS >> b0 da 00 00 4f c2 e0 00 00:18:39.813 SMART RETURN STATUS >> >> SMART Self-test log structure revision number 1 >> Num Test_Description Status Remaining=20 >> LifeTime(hours) LBA_of_first_error >> # 1 Abort offline test Aborted by host 90% =20 >> 480 - >> # 2 Extended offline Completed without error 00% =20 >> 479 - >> # 3 Short offline Completed without error 00% =20 >> 476 - >> # 4 Abort offline test Aborted by host 90% =20 >> 476 - >> # 5 Short offline Completed without error 00% =20 >> 474 - >> # 6 Short offline Completed without error 00% =20 >> 463 - >> # 7 Short offline Completed without error 00% =20 >> 460 - >> # 8 Extended offline Completed without error 00% =20 >> 460 - >> # 9 Short offline Completed without error 00% =20 >> 440 - >> #10 Short offline Completed without error 00% =20 >> 418 - >> #11 Short offline Completed: read failure 00% 395=20 >> 313962848 >> #12 Short offline Completed without error 00% =20 >> 373 - >> #13 Extended offline Completed without error 00% =20 >> 352 - >> #14 Short offline Completed without error 00% =20 >> 350 - >> #15 Short offline Completed without error 00% =20 >> 328 - >> #16 Short offline Completed without error 00% =20 >> 305 - >> #17 Short offline Completed without error 00% =20 >> 283 - >> #18 Short offline Completed without error 00% =20 >> 260 - >> #19 Short offline Completed without error 00% =20 >> 238 - >> #20 Short offline Completed without error 00% =20 >> 215 - >> #21 Extended offline Completed without error 00% =20 >> 195 - >> >> Device does not support Selective Self Tests/Logging |