more iec-bus tests
Fixed two more VIA gaps: serial clocks now update CB1 flags and PB input latches, and PCR/ORB writes cannot overwrite active CB2 serial data
WD1770: 32 new tests pass
Fixed stale SP/CNT levels after fast-serial connection changes and bus reset.
cpu port bitfade bugs fixed
tests added
hint for visual checks and code coverage report
Added 96 CPU/CIA compatibility cases