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kSEMAW is a workspace for the analysis of Spectrophotometric (SP), Ellipsometric (ELI) and Photothermal Deflection Spectroscopy (PDS) measurements. The letter “k” indicates the use of the Qt libraries.
Features
- simulate SP, ELI and PDS measurements of a multilayer structure, being known the thicknesses and the complex refractive indexes of each material composing the different layers
- calculate the complex refractive index and the thickness of a given layer (if ``thin'' ) from experimental measurements (SP, ELI, PDS), being known the thicknesses and the complex refractive indexes of all the other layers composing the structure
- evaluate the mean value of physical quantities, weighted on a given international standard spectrum (such as ASTM G173-03) or on own customized reference spectrum
- predict the angular trend by using a realistic model or the equivalent model algorithm
Project Samples
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