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AtomicJ

Application for analysis of AFM data

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Description

AtomicJ is an application for analysis of force microscopy recordings, including images and force curves. It allows for fast and reliable processing of single force curves and force maps, providing estimation of the mechanical properties of the sample. AtomicJ supports a wide range of contact mechanics models, including the models for blunt tips, the corrections for the effect of finite sample thickness, models of adhesive contact and models of spherical indentation of hyperelastic material. It implements novel procedures for analysis of force curves which allow for greater resistance to model deviations. AtomicJ can process force maps, it generates maps of Young’s modulus, adhesion force, transition indentation, sample height and the deformation. The results of force maps processing can be visualized in 3D.

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Additional Project Details

Intended Audience

Science/Research

User Interface

Java Swing

Programming Language

Java

Registered

2013-02-14

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