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From: Dominik K. <dom...@gm...> - 2016-04-25 15:23:07
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Dear xrayutilities users, I have updated the release candidate [1] which now includes much faster calculation of the diffraction signal. Especially the dynamical diffraction model increased its speed more than 25times due to significant optimization work. Kinematical diffraction models also decreased their calculation time by roughly a factor of 2. after one more round of testing the final release will take place soon. regards Dominik [1] release candidate 1.3rc2 release is available at https://sourceforge.net/projects/xrayutilities/files/ On Tue, Apr 19, 2016 at 12:48 PM, Dominik Kriegner < dom...@gm...> wrote: > > Dear xrayutilities users, > > I want to announce a new feature of xrayutilities which will be included in the upcoming release 1.3. > > Since xrayutilties already for a long time includes a database of materials and is able to calculate their optical properties it seemed like an obvious addition to add some simulation abilities which need those material parameters as input. > > Within the current development version [1,2] such support for x-ray reflectivity and x-ray diffraction calculation for thin films was added. Several different models for diffraction are available and documented [3]. > > Clearly more testing of the code is needed to ensure its correct function in all use cases. I encourage you to try the new abilities and let me know any feedback/problems you might have. In particular interesting for me is if the documentation and new example-scripts are sufficient for you to get started with your simulations! > > regards > Dominik > > [1] https://sourceforge.net/p/xrayutilities/code/ci/master/tree/ > [2] a release candidate for the 1.3 release is available at https://sourceforge.net/projects/xrayutilities/files/ > [3] http://xrayutilities.sourceforge.net/simulations.html |
