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From: <sv...@va...> - 2010-10-11 17:41:56
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Author: sewardj Date: 2010-10-11 18:41:46 +0100 (Mon, 11 Oct 2010) New Revision: 11426 Log: Improve NEON instruction set tests, so as to run tests with different data in high and low d-register halves. (Dmitry Zhurikhin, zh...@is...) Modified: trunk/none/tests/arm/neon128.c trunk/none/tests/arm/neon128.stdout.exp trunk/none/tests/arm/neon64.c trunk/none/tests/arm/neon64.stdout.exp [... diff too large to include ...] |