From: Ciro S. <mo...@ol...> - 2005-02-12 19:39:00
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Hullo, On a small server I use for my works at home I have two disks, the first one is a Samsung, 80GB that I use as the main disk that contains the OS (FreeBSD 5-STABLE) and users homes, The second is a Samsung, again, but a 120GB recently purchased. Some months ago I discovered 2 bad blocks on the first disk that I managed to "correct" with dd using the bad blocks how to and applying some changes for FreeBSD. The disk seems to work correctly, smart tests are not logging errors anymore (even though I still have smartd warning about those 2 blocks in /var/log/messages), fsck does its job and it seems not to find any other fs inconsistencies. But what I have noticed is that the old disk makes a lot more of noise when reading or writing, while the newest one (that is the same model) is a lot silent and even faster... The question is: how can I test the 80GB disk throughtfully? and eventually should I ask for a replacement? (the warranty should still be valid). thnx in advance. Ciro. P.S. Here attached the smartd output of the first HD, The second one is a SP1203N and seems to not have any problem yet. also, while the serial number if the newest disk seems to be there, the first one (an SP0802N) only displays zeroes... moray@linc [/usr/storage] jobs 0 on ttyp0# smartctl -a /dev/ad0 smartctl version 5.34 [i386-unknown-freebsd5.3] Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP0802N Serial Number: 00000000000000 Firmware Version: TK100-24 User Capacity: 80,060,424,192 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sat Feb 12 20:39:29 2005 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (2880) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 2 3 Spin_Up_Time 0x0007 077 046 000 Pre-fail Always - 4352 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 281 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0024 091 086 000 Old_age Offline - 9459 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 1008h+24m 10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 281 194 Temperature_Celsius 0x0022 145 124 000 Old_age Always - 31 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 147515907 196 Reallocated_Event_Count 0x0012 100 100 000 Old_age Always - 2 197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0 198 Offline_Uncorrectable 0x0031 100 100 010 Pre-fail Offline - 2 199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail Always - 0 200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 SMART Error Log Version: 1 ATA Error Count: 52 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 52 occurred at disk power-on lifetime: 119 hours (4 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 02 df 9a e1 Error: UNC 1 sectors at LBA = 0x019adf02 = 26926850 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 02 df 9a e1 00 02:06:05.688 READ DMA c8 00 01 01 df 9a e1 00 02:06:05.688 READ DMA c8 00 01 00 df 9a e1 00 02:06:05.688 READ DMA c8 00 01 ff de 9a e1 00 02:06:05.688 READ DMA c8 00 01 fe de 9a e1 00 02:06:05.688 READ DMA Error 51 occurred at disk power-on lifetime: 119 hours (4 days + 23 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 80 df de 9a e1 Error: UNC 128 sectors at LBA = 0x019adedf = 26926815 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 df de 9a e1 00 02:06:04.563 READ DMA c8 00 80 5f de 9a e1 00 02:06:04.563 READ DMA c8 00 20 bf be 9c e1 00 02:06:04.500 READ DMA c8 00 80 df dd 9a e1 00 02:06:04.500 READ DMA c8 00 20 ff a4 9b e1 00 02:06:04.500 READ DMA Error 50 occurred at disk power-on lifetime: 118 hours (4 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 02 df 9a e1 Error: UNC 1 sectors at LBA = 0x019adf02 = 26926850 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 02 df 9a e1 00 00:33:03.188 READ DMA c8 00 01 01 df 9a e1 00 00:33:03.188 READ DMA c8 00 01 00 df 9a e1 00 00:33:03.188 READ DMA c8 00 01 ff de 9a e1 00 00:33:03.188 READ DMA c8 00 01 fe de 9a e1 00 00:33:03.188 READ DMA Error 49 occurred at disk power-on lifetime: 118 hours (4 days + 22 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 80 df de 9a e1 Error: UNC 128 sectors at LBA = 0x019adedf = 26926815 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 df de 9a e1 00 00:32:49.750 READ DMA c8 00 80 5f de 9a e1 00 00:32:49.750 READ DMA c8 00 20 bf be 9c e1 00 00:32:49.750 READ DMA c8 00 80 df dd 9a e1 00 00:32:49.750 READ DMA c8 00 20 ff a4 9b e1 00 00:32:49.750 READ DMA Error 48 occurred at disk power-on lifetime: 117 hours (4 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 80 df de 9a e1 Error: UNC 128 sectors at LBA = 0x019adedf = 26926815 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 80 df de 9a e1 00 00:01:25.875 READ DMA c8 00 80 5f de 9a e1 00 00:01:25.875 READ DMA c8 00 20 bf be 9c e1 00 00:01:25.875 READ DMA c8 00 80 df dd 9a e1 00 00:01:25.875 READ DMA c8 00 20 ff a4 9b e1 00 00:01:25.813 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 886 # - # 2 Extended offline Completed without error 00% 171 # - # 3 Extended offline Completed without error 00% 161 # - # 4 Short offline Completed without error 00% 160 # - # 5 Extended offline Completed without error 00% 138 # - # 6 Extended offline Completed without error 00% 136 # - # 7 Extended offline Completed without error 00% 124 # - # 8 Extended offline Completed: read failure 00% 118 # 26926850 Device does not support Selective Self Tests/Logging |
From: Delian K. <gm...@kr...> - 2005-02-13 03:04:15
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Ciro Scognamiglio wrote: > The question is: how can I test the 80GB disk throughtfully? and > eventually should I ask for a replacement? (the warranty should still be > valid). dd if=/dev/ad0 of=/dev/null #this will destroy your data dd if=/dev/zero of=/dev/ad0 You could check badblocks(8) for a non destructive read-write test option. > 197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always > - 0 This looks OK to me. What does smartd say in the logs ? Cheers, Delian |