From: Andrew Y. <and...@gm...> - 2005-07-04 13:34:05
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Last night I received an email from smartctl saying: The following warning/error was logged by the smartd daemon: Device: /dev/hda, ATA error count increased from 0 to 3 I ran two "smartctl -t long /dev/hda" checks within the 12 hours or so since then, the output of 'smartctl -a /dev/hda' is listed below, at the end of the email. Does anyone know why this would happen? Should I buy a new drive and get rid of this one, or is it just a false alarm? # smartctl -a /dev/hda smartctl version 5.33 [i386-pc-linux-gnu] Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ =3D=3D=3D START OF INFORMATION SECTION =3D=3D=3D Device Model: ST3200822A Serial Number: 3LJ1SEC0 Firmware Version: 3.01 User Capacity: 200,049,647,616 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Sun Jul 3 17:20:41 2005 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled =3D=3D=3D START OF READ SMART DATA SECTION =3D=3D=3D SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabl= ed. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE =20 UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 056 053 006 Pre-fail=20 Always - 193721133 3 Spin_Up_Time 0x0003 096 096 000 Pre-fail=20 Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age =20 Always - 25 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail=20 Always - 0 7 Seek_Error_Rate 0x000f 082 060 030 Pre-fail=20 Always - 178869778 9 Power_On_Hours 0x0032 093 093 000 Old_age =20 Always - 6192 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail=20 Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age =20 Always - 29 194 Temperature_Celsius 0x0022 034 040 000 Old_age =20 Always - 34 195 Hardware_ECC_Recovered 0x001a 056 053 000 Old_age =20 Always - 193721133 197 Current_Pending_Sector 0x0012 100 100 000 Old_age =20 Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age =20 Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age =20 Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age =20 Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age =20 Always - 0 SMART Error Log Version: 1 ATA Error Count: 3 CR =3D Command Register [HEX] FR =3D Features Register [HEX] SC =3D Sector Count Register [HEX] SN =3D Sector Number Register [HEX] CL =3D Cylinder Low Register [HEX] CH =3D Cylinder High Register [HEX] DH =3D Device/Head Register [HEX] DC =3D Device Command Register [HEX] ER =3D Error register [HEX] ST =3D Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=3Ddays, hh=3Dhours, mm=3Dminutes, SS=3Dsec, and sss=3Dmillisec. It "wraps" after 49.710 days. Error 3 occurred at disk power-on lifetime: 6173 hours (257 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 5f e4 59 e0 Error: UNC at LBA =3D 0x0059e45f =3D 5891167 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 5b e4 59 e0 00 08:45:59.389 READ DMA EXT 25 00 08 e3 ce a9 e0 00 08:45:53.859 READ DMA EXT 25 00 08 b3 d2 b0 e0 00 08:45:53.859 READ DMA EXT 25 00 08 9b 62 2e e0 00 08:45:53.849 READ DMA EXT 35 00 80 eb b3 12 e0 00 08:45:53.828 WRITE DMA EXT Error 2 occurred at disk power-on lifetime: 6173 hours (257 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 5f e4 59 e0 Error: UNC at LBA =3D 0x0059e45f =3D 5891167 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 5b e4 59 e0 00 08:45:46.693 READ DMA EXT 25 00 58 03 25 5a e0 00 08:45:53.859 READ DMA EXT 25 00 a0 5b 24 5a e0 00 08:45:53.859 READ DMA EXT 25 00 18 eb e5 59 e0 00 08:45:53.849 READ DMA EXT 25 00 08 db ce a9 e0 00 08:45:53.828 READ DMA EXT Error 1 occurred at disk power-on lifetime: 6173 hours (257 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 5f e4 59 e0 Error: UNC at LBA =3D 0x0059e45f =3D 5891167 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 60 5b e4 59 e0 00 08:45:46.693 READ DMA EXT 25 00 48 0b c5 59 e0 00 08:45:46.687 READ DMA EXT 25 00 48 9b 86 59 e0 00 08:45:46.684 READ DMA EXT 25 00 58 43 85 59 e0 00 08:45:46.679 READ DMA EXT 25 00 28 4b 67 59 e0 00 08:45:46.672 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining=20 LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 6185 = - # 2 Extended offline Completed without error 00% 6175 = - # 3 Short offline Completed without error 00% 6090 = - # 4 Short offline Completed without error 00% 5888 = - # 5 Extended offline Completed without error 00% 5888 = - # 6 Short offline Completed without error 00% 5667 = - # 7 Extended offline Completed without error 00% 4365 = - # 8 Short offline Completed without error 00% 2132 = - # 9 Extended offline Completed without error 00% 1272 = - <older tests snipped to save space> SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. |