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From: Jim T. <em...@ju...> - 2006-07-12 22:28:44
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Every half hour I get a notification from smartd that my hard drive has 5 offline uncorrectable sectors. $ tail /var/log/messages Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Fearing that the drive was failing, I ran the drive through Samsung's HUTIL surface scan utility (multiple times) and found no errors. Then I ran the smartctl offline long test, and though the test reports "PASSED", I noticed that (in addition to the Offline uncorrectable sectors) there is a reallocated event count but not a reallocated sector count. # smartctl -a /dev/hda smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP1614N Serial Number: S016J10XA43633 Firmware Version: TM100-24 User Capacity: 160,041,885,696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Tue Jul 11 12:03:42 2006 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5760) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 96) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 954 3 Spin_Up_Time 0x0007 067 050 000 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 76 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0024 083 083 000 Old_age Offline - 12764 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age Always - 11868h+16m 10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 42 194 Temperature_Celsius 0x0022 139 109 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 940776482 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age Always - 5 197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0 198 Offline_Uncorrectable 0x0031 098 098 010 Pre-fail Offline - 5 199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail Always - 0 200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 11580 - Device does not support Selective Self Tests/Logging So my question is what do I do to clear out the offline uncorrectable sectors, or are there actually problematic sectors? Without a failed test and LBA of the sector I'm sort of at a loss as to figuring out what's going on. Any suggestions would be appreciated! Thanks, -Jim |
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From: Jim T. <jlt...@gm...> - 2006-07-11 16:28:27
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Every half hour I get a notification from smartd that my hard drive has 5 offline uncorrectable sectors. $ tail /var/log/messages Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline uncorrectable sectors Fearing that the drive was failing, I ran the drive through Samsung's HUTIL surface scan utility (multiple times) and found no errors. Then I ran the smartctl offline long test, and though the test reports "PASSED", I noticed that (in addition to the Offline uncorrectable sectors) there is a reallocated event count but not a reallocated sector count. # smartctl -a /dev/hda smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG SP1614N Serial Number: S016J10XA43633 Firmware Version: TM100-24 User Capacity: 160,041,885,696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Tue Jul 11 12:03:42 2006 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5760) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 96) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 954 3 Spin_Up_Time 0x0007 067 050 000 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 76 5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0024 083 083 000 Old_age Offline - 12764 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age Always - 11868h+16m 10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 42 194 Temperature_Celsius 0x0022 139 109 000 Old_age Always - 33 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 940776482 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age Always - 5 197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0 198 Offline_Uncorrectable 0x0031 098 098 010 Pre-fail Offline - 5 199 UDMA_CRC_Error_Count 0x000b 100 100 051 Pre-fail Always - 0 200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 11580 - Device does not support Selective Self Tests/Logging So my question is what do I do to clear out the offline uncorrectable sectors, or are there actually problematic sectors? Without a failed test and LBA of the sector I'm sort of at a loss as to figuring out what's going on. Any suggestions would be appreciated! Thanks, -Jim |
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From: Justin P. <jp...@lu...> - 2006-07-13 11:25:43
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Your drive is about to die, RMA it ASAP. I had the same thing, mine died 24 hours later. Justin. On Wed, 12 Jul 2006, Jim Truitt wrote: > Every half hour I get a notification from smartd that my hard drive has 5 > offline uncorrectable sectors. > > $ tail /var/log/messages > Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > uncorrectable sectors > ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > uncorrectable sectors > Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > uncorrectable sectors > Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > uncorrectable sectors > > Fearing that the drive was failing, I ran the drive through Samsung's HUTIL > surface scan utility (multiple times) and found no errors. > > Then I ran the smartctl offline long test, and though the test reports > "PASSED", I noticed that (in addition to the Offline uncorrectable sectors) > there is a reallocated event count but not a reallocated sector count. > > # smartctl -a /dev/hda > smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce > Allen > Home page is http://smartmontools.sourceforge.net/ > > === START OF INFORMATION SECTION === > Device Model: SAMSUNG SP1614N > Serial Number: S016J10XA43633 > Firmware Version: TM100-24 > User Capacity: 160,041,885,696 bytes > Device is: In smartctl database [for details use: -P show] > ATA Version is: 7 > ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 > Local Time is: Tue Jul 11 12:03:42 2006 EDT > SMART support is: Available - device has SMART capability. > SMART support is: Enabled > > === START OF READ SMART DATA SECTION === > SMART overall-health self-assessment test result: PASSED > > General SMART Values: > Offline data collection status: (0x02) Offline data collection activity > was completed without error. > Auto Offline Data Collection: > Disabled. > Self-test execution status: ( 0) The previous self-test routine > completed > without error or no self-test has > ever > been run. > Total time to complete Offline > data collection: (5760) seconds. > Offline data collection > capabilities: (0x1b) SMART execute Offline immediate. > Auto Offline data collection on/off > support. > Suspend Offline collection upon new > command. > Offline surface scan supported. > Self-test supported. > No Conveyance Self-test supported. > No Selective Self-test supported. > SMART capabilities: (0x0003) Saves SMART data before entering > power-saving mode. > Supports SMART auto save timer. > Error logging capability: (0x01) Error logging supported. > No General Purpose Logging support. > Short self-test routine > recommended polling time: ( 1) minutes. > Extended self-test routine > recommended polling time: ( 96) minutes. > > SMART Attributes Data Structure revision number: 16 > Vendor Specific SMART Attributes with Thresholds: > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH > TYPE UPDATED WHEN_FAILED RAW_VALUE > 1 Raw_Read_Error_Rate 0x000b 100 100 > 051 Pre-fail Always - 954 > 3 Spin_Up_Time 0x0007 067 050 > 000 Pre-fail Always - 5760 > 4 Start_Stop_Count 0x0032 100 100 000 Old_age > Always - 76 > 5 Reallocated_Sector_Ct 0x0033 253 253 > 010 Pre-fail Always - 0 > 7 Seek_Error_Rate 0x000b 253 253 > 051 Pre-fail Always - 0 > 8 Seek_Time_Performance 0x0024 083 083 000 Old_age > Offline - 12764 > 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age > Always - 11868h+16m > 10 Spin_Retry_Count 0x0013 253 253 > 049 Pre-fail Always - 0 > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age > Always - 42 > 194 Temperature_Celsius 0x0022 139 109 000 Old_age > Always - 33 > 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age > Always - 940776482 > 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age > Always - 5 > 197 Current_Pending_Sector 0x0033 253 253 > 010 Pre-fail Always - 0 > 198 Offline_Uncorrectable 0x0031 098 098 > 010 Pre-fail Offline - 5 > 199 UDMA_CRC_Error_Count 0x000b 100 100 > 051 Pre-fail Always - 0 > 200 Multi_Zone_Error_Rate 0x000b 100 100 > 051 Pre-fail Always - 0 > 201 Soft_Read_Error_Rate 0x000b 100 100 > 051 Pre-fail Always - 0 > > SMART Error Log Version: 1 > No Errors Logged > > SMART Self-test log structure revision number 1 > Num Test_Description Status Remaining > LifeTime(hours) LBA_of_first_error > # 1 Extended offline Completed without error 00% 11580 > - > > Device does not support Selective Self Tests/Logging > > So my question is what do I do to clear out the offline uncorrectable > sectors, or are there actually problematic sectors? Without a failed test > and LBA of the sector I'm sort of at a loss as to figuring out what's going > on. > > Any suggestions would be appreciated! > > Thanks, > -Jim > |
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From: Jim T. <em...@ju...> - 2006-07-13 13:59:15
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Hi Justin, thanks for the advice - that was my gut reaction as well. Unfortunately, in order to RMA the drive, it has to fail the Samsung HUTIL drive check. I ran all of the hard drive tests (mulitple times) and it found no problems. Did your drive also pass the smartd self-assessment test, i.e., give no LBAs of problems? -Jim On 7/13/06, Justin Piszcz <jp...@lu...> wrote: > > Your drive is about to die, RMA it ASAP. I had the same thing, mine died > 24 hours later. > > Justin. > > On Wed, 12 Jul 2006, Jim Truitt wrote: > > > Every half hour I get a notification from smartd that my hard drive has > 5 > > offline uncorrectable sectors. > > > > $ tail /var/log/messages > > Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > > > Fearing that the drive was failing, I ran the drive through Samsung's > HUTIL > > surface scan utility (multiple times) and found no errors. > > > > Then I ran the smartctl offline long test, and though the test reports > > "PASSED", I noticed that (in addition to the Offline uncorrectable > sectors) > > there is a reallocated event count but not a reallocated sector count. > > > > # smartctl -a /dev/hda > > smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce > > Allen > > Home page is http://smartmontools.sourceforge.net/ > > > > === START OF INFORMATION SECTION === > > Device Model: SAMSUNG SP1614N > > Serial Number: S016J10XA43633 > > Firmware Version: TM100-24 > > User Capacity: 160,041,885,696 bytes > > Device is: In smartctl database [for details use: -P show] > > ATA Version is: 7 > > ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 > > Local Time is: Tue Jul 11 12:03:42 2006 EDT > > SMART support is: Available - device has SMART capability. > > SMART support is: Enabled > > > > === START OF READ SMART DATA SECTION === > > SMART overall-health self-assessment test result: PASSED > > > > General SMART Values: > > Offline data collection status: (0x02) Offline data collection activity > > was completed without error. > > Auto Offline Data Collection: > > Disabled. > > Self-test execution status: ( 0) The previous self-test routine > > completed > > without error or no self-test has > > ever > > been run. > > Total time to complete Offline > > data collection: (5760) seconds. > > Offline data collection > > capabilities: (0x1b) SMART execute Offline immediate. > > Auto Offline data collection > on/off > > support. > > Suspend Offline collection upon > new > > command. > > Offline surface scan supported. > > Self-test supported. > > No Conveyance Self-test > supported. > > No Selective Self-test supported. > > SMART capabilities: (0x0003) Saves SMART data before entering > > power-saving mode. > > Supports SMART auto save timer. > > Error logging capability: (0x01) Error logging supported. > > No General Purpose Logging > support. > > Short self-test routine > > recommended polling time: ( 1) minutes. > > Extended self-test routine > > recommended polling time: ( 96) minutes. > > > > SMART Attributes Data Structure revision number: 16 > > Vendor Specific SMART Attributes with Thresholds: > > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH > > TYPE UPDATED WHEN_FAILED RAW_VALUE > > 1 Raw_Read_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 954 > > 3 Spin_Up_Time 0x0007 067 050 > > 000 Pre-fail Always - 5760 > > 4 Start_Stop_Count 0x0032 100 100 000 Old_age > > Always - 76 > > 5 Reallocated_Sector_Ct 0x0033 253 253 > > 010 Pre-fail Always - 0 > > 7 Seek_Error_Rate 0x000b 253 253 > > 051 Pre-fail Always - 0 > > 8 Seek_Time_Performance 0x0024 083 083 000 Old_age > > Offline - 12764 > > 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age > > Always - 11868h+16m > > 10 Spin_Retry_Count 0x0013 253 253 > > 049 Pre-fail Always - 0 > > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age > > Always - 42 > > 194 Temperature_Celsius 0x0022 139 109 000 Old_age > > Always - 33 > > 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age > > Always - 940776482 > > 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age > > Always - 5 > > 197 Current_Pending_Sector 0x0033 253 253 > > 010 Pre-fail Always - 0 > > 198 Offline_Uncorrectable 0x0031 098 098 > > 010 Pre-fail Offline - 5 > > 199 UDMA_CRC_Error_Count 0x000b 100 100 > > 051 Pre-fail Always - 0 > > 200 Multi_Zone_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 0 > > 201 Soft_Read_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 0 > > > > SMART Error Log Version: 1 > > No Errors Logged > > > > SMART Self-test log structure revision number 1 > > Num Test_Description Status Remaining > > LifeTime(hours) LBA_of_first_error > > # 1 Extended offline Completed without error 00% 11580 > > - > > > > Device does not support Selective Self Tests/Logging > > > > So my question is what do I do to clear out the offline uncorrectable > > sectors, or are there actually problematic sectors? Without a failed > test > > and LBA of the sector I'm sort of at a loss as to figuring out what's > going > > on. > > > > Any suggestions would be appreciated! > > > > Thanks, > > -Jim > > > > |
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From: Justin P. <jp...@lu...> - 2006-07-13 15:51:45
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Did your drive also pass the smartd self-assessment test, i.e., give no LBAs of problems? Yes sir. Get all the data off the drive, unmount it. Run this for a few days: /usr/bin/time badblocks -b 512 -s -v -w /dev/hdg Then it should make the drive entirely **** the bed. On Thu, 13 Jul 2006, Jim Truitt wrote: > Hi Justin, thanks for the advice - that was my gut reaction as well. > Unfortunately, in order to RMA the drive, it has to fail the Samsung HUTIL > drive check. I ran all of the hard drive tests (mulitple times) and it > found no problems. Did your drive also pass the smartd self-assessment > test, i.e., give no LBAs of problems? > > -Jim > > On 7/13/06, Justin Piszcz <jp...@lu...> wrote: >> >> Your drive is about to die, RMA it ASAP. I had the same thing, mine died >> 24 hours later. >> >> Justin. >> >> On Wed, 12 Jul 2006, Jim Truitt wrote: >> >> > Every half hour I get a notification from smartd that my hard drive has >> 5 >> > offline uncorrectable sectors. >> > >> > $ tail /var/log/messages >> > Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline >> > uncorrectable sectors >> > ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline >> > uncorrectable sectors >> > Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline >> > uncorrectable sectors >> > Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline >> > uncorrectable sectors >> > >> > Fearing that the drive was failing, I ran the drive through Samsung's >> HUTIL >> > surface scan utility (multiple times) and found no errors. >> > >> > Then I ran the smartctl offline long test, and though the test reports >> > "PASSED", I noticed that (in addition to the Offline uncorrectable >> sectors) >> > there is a reallocated event count but not a reallocated sector count. >> > >> > # smartctl -a /dev/hda >> > smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce >> > Allen >> > Home page is http://smartmontools.sourceforge.net/ >> > >> > === START OF INFORMATION SECTION === >> > Device Model: SAMSUNG SP1614N >> > Serial Number: S016J10XA43633 >> > Firmware Version: TM100-24 >> > User Capacity: 160,041,885,696 bytes >> > Device is: In smartctl database [for details use: -P show] >> > ATA Version is: 7 >> > ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 >> > Local Time is: Tue Jul 11 12:03:42 2006 EDT >> > SMART support is: Available - device has SMART capability. >> > SMART support is: Enabled >> > >> > === START OF READ SMART DATA SECTION === >> > SMART overall-health self-assessment test result: PASSED >> > >> > General SMART Values: >> > Offline data collection status: (0x02) Offline data collection activity >> > was completed without error. >> > Auto Offline Data Collection: >> > Disabled. >> > Self-test execution status: ( 0) The previous self-test routine >> > completed >> > without error or no self-test has >> > ever >> > been run. >> > Total time to complete Offline >> > data collection: (5760) seconds. >> > Offline data collection >> > capabilities: (0x1b) SMART execute Offline immediate. >> > Auto Offline data collection >> on/off >> > support. >> > Suspend Offline collection upon >> new >> > command. >> > Offline surface scan supported. >> > Self-test supported. >> > No Conveyance Self-test >> supported. >> > No Selective Self-test supported. >> > SMART capabilities: (0x0003) Saves SMART data before entering >> > power-saving mode. >> > Supports SMART auto save timer. >> > Error logging capability: (0x01) Error logging supported. >> > No General Purpose Logging >> support. >> > Short self-test routine >> > recommended polling time: ( 1) minutes. >> > Extended self-test routine >> > recommended polling time: ( 96) minutes. >> > >> > SMART Attributes Data Structure revision number: 16 >> > Vendor Specific SMART Attributes with Thresholds: >> > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH >> > TYPE UPDATED WHEN_FAILED RAW_VALUE >> > 1 Raw_Read_Error_Rate 0x000b 100 100 >> > 051 Pre-fail Always - 954 >> > 3 Spin_Up_Time 0x0007 067 050 >> > 000 Pre-fail Always - 5760 >> > 4 Start_Stop_Count 0x0032 100 100 000 Old_age >> > Always - 76 >> > 5 Reallocated_Sector_Ct 0x0033 253 253 >> > 010 Pre-fail Always - 0 >> > 7 Seek_Error_Rate 0x000b 253 253 >> > 051 Pre-fail Always - 0 >> > 8 Seek_Time_Performance 0x0024 083 083 000 Old_age >> > Offline - 12764 >> > 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age >> > Always - 11868h+16m >> > 10 Spin_Retry_Count 0x0013 253 253 >> > 049 Pre-fail Always - 0 >> > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age >> > Always - 42 >> > 194 Temperature_Celsius 0x0022 139 109 000 Old_age >> > Always - 33 >> > 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age >> > Always - 940776482 >> > 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age >> > Always - 5 >> > 197 Current_Pending_Sector 0x0033 253 253 >> > 010 Pre-fail Always - 0 >> > 198 Offline_Uncorrectable 0x0031 098 098 >> > 010 Pre-fail Offline - 5 >> > 199 UDMA_CRC_Error_Count 0x000b 100 100 >> > 051 Pre-fail Always - 0 >> > 200 Multi_Zone_Error_Rate 0x000b 100 100 >> > 051 Pre-fail Always - 0 >> > 201 Soft_Read_Error_Rate 0x000b 100 100 >> > 051 Pre-fail Always - 0 >> > >> > SMART Error Log Version: 1 >> > No Errors Logged >> > >> > SMART Self-test log structure revision number 1 >> > Num Test_Description Status Remaining >> > LifeTime(hours) LBA_of_first_error >> > # 1 Extended offline Completed without error 00% 11580 >> > - >> > >> > Device does not support Selective Self Tests/Logging >> > >> > So my question is what do I do to clear out the offline uncorrectable >> > sectors, or are there actually problematic sectors? Without a failed >> test >> > and LBA of the sector I'm sort of at a loss as to figuring out what's >> going >> > on. >> > >> > Any suggestions would be appreciated! >> > >> > Thanks, >> > -Jim >> > >> >> > |
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