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      From: Jim T. <em...@ju...> - 2006-07-13 13:59:15
      
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| Hi Justin, thanks for the advice - that was my gut reaction as well. Unfortunately, in order to RMA the drive, it has to fail the Samsung HUTIL drive check. I ran all of the hard drive tests (mulitple times) and it found no problems. Did your drive also pass the smartd self-assessment test, i.e., give no LBAs of problems? -Jim On 7/13/06, Justin Piszcz <jp...@lu...> wrote: > > Your drive is about to die, RMA it ASAP. I had the same thing, mine died > 24 hours later. > > Justin. > > On Wed, 12 Jul 2006, Jim Truitt wrote: > > > Every half hour I get a notification from smartd that my hard drive has > 5 > > offline uncorrectable sectors. > > > > $ tail /var/log/messages > > Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline > > uncorrectable sectors > > > > Fearing that the drive was failing, I ran the drive through Samsung's > HUTIL > > surface scan utility (multiple times) and found no errors. > > > > Then I ran the smartctl offline long test, and though the test reports > > "PASSED", I noticed that (in addition to the Offline uncorrectable > sectors) > > there is a reallocated event count but not a reallocated sector count. > > > > # smartctl -a /dev/hda > > smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce > > Allen > > Home page is http://smartmontools.sourceforge.net/ > > > > === START OF INFORMATION SECTION === > > Device Model: SAMSUNG SP1614N > > Serial Number: S016J10XA43633 > > Firmware Version: TM100-24 > > User Capacity: 160,041,885,696 bytes > > Device is: In smartctl database [for details use: -P show] > > ATA Version is: 7 > > ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 > > Local Time is: Tue Jul 11 12:03:42 2006 EDT > > SMART support is: Available - device has SMART capability. > > SMART support is: Enabled > > > > === START OF READ SMART DATA SECTION === > > SMART overall-health self-assessment test result: PASSED > > > > General SMART Values: > > Offline data collection status: (0x02) Offline data collection activity > > was completed without error. > > Auto Offline Data Collection: > > Disabled. > > Self-test execution status: ( 0) The previous self-test routine > > completed > > without error or no self-test has > > ever > > been run. > > Total time to complete Offline > > data collection: (5760) seconds. > > Offline data collection > > capabilities: (0x1b) SMART execute Offline immediate. > > Auto Offline data collection > on/off > > support. > > Suspend Offline collection upon > new > > command. > > Offline surface scan supported. > > Self-test supported. > > No Conveyance Self-test > supported. > > No Selective Self-test supported. > > SMART capabilities: (0x0003) Saves SMART data before entering > > power-saving mode. > > Supports SMART auto save timer. > > Error logging capability: (0x01) Error logging supported. > > No General Purpose Logging > support. > > Short self-test routine > > recommended polling time: ( 1) minutes. > > Extended self-test routine > > recommended polling time: ( 96) minutes. > > > > SMART Attributes Data Structure revision number: 16 > > Vendor Specific SMART Attributes with Thresholds: > > ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH > > TYPE UPDATED WHEN_FAILED RAW_VALUE > > 1 Raw_Read_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 954 > > 3 Spin_Up_Time 0x0007 067 050 > > 000 Pre-fail Always - 5760 > > 4 Start_Stop_Count 0x0032 100 100 000 Old_age > > Always - 76 > > 5 Reallocated_Sector_Ct 0x0033 253 253 > > 010 Pre-fail Always - 0 > > 7 Seek_Error_Rate 0x000b 253 253 > > 051 Pre-fail Always - 0 > > 8 Seek_Time_Performance 0x0024 083 083 000 Old_age > > Offline - 12764 > > 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age > > Always - 11868h+16m > > 10 Spin_Retry_Count 0x0013 253 253 > > 049 Pre-fail Always - 0 > > 12 Power_Cycle_Count 0x0032 100 100 000 Old_age > > Always - 42 > > 194 Temperature_Celsius 0x0022 139 109 000 Old_age > > Always - 33 > > 195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age > > Always - 940776482 > > 196 Reallocated_Event_Count 0x0012 098 098 000 Old_age > > Always - 5 > > 197 Current_Pending_Sector 0x0033 253 253 > > 010 Pre-fail Always - 0 > > 198 Offline_Uncorrectable 0x0031 098 098 > > 010 Pre-fail Offline - 5 > > 199 UDMA_CRC_Error_Count 0x000b 100 100 > > 051 Pre-fail Always - 0 > > 200 Multi_Zone_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 0 > > 201 Soft_Read_Error_Rate 0x000b 100 100 > > 051 Pre-fail Always - 0 > > > > SMART Error Log Version: 1 > > No Errors Logged > > > > SMART Self-test log structure revision number 1 > > Num Test_Description Status Remaining > > LifeTime(hours) LBA_of_first_error > > # 1 Extended offline Completed without error 00% 11580 > > - > > > > Device does not support Selective Self Tests/Logging > > > > So my question is what do I do to clear out the offline uncorrectable > > sectors, or are there actually problematic sectors? Without a failed > test > > and LBA of the sector I'm sort of at a loss as to figuring out what's > going > > on. > > > > Any suggestions would be appreciated! > > > > Thanks, > > -Jim > > > > |