Re: [smartmontools-support] 5 Offline uncorrectable sectors - but no failed self-tests

[Justin P. <jp...@lu...>]

Your drive is about to die, RMA it ASAP.  I had the same thing, mine died 
24 hours later.

Justin.

On Wed, 12 Jul 2006, Jim Truitt wrote:

> Every half hour I get a notification from smartd that my hard drive has 5
> offline uncorrectable sectors.
>
> $ tail /var/log/messages
> Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
> uncorrectable sectors
> ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
> uncorrectable sectors
> Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
> uncorrectable sectors
> Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
> uncorrectable sectors
>
> Fearing that the drive was failing, I ran the drive through Samsung's HUTIL
> surface scan utility (multiple times) and found no errors.
>
> Then I ran the smartctl offline long test, and though the test reports
> "PASSED", I noticed that (in addition to the Offline uncorrectable sectors)
> there is a reallocated event count but not a reallocated sector count.
>
> # smartctl -a /dev/hda
> smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce
> Allen
> Home page is http://smartmontools.sourceforge.net/
>
> === START OF INFORMATION SECTION ===
> Device Model:     SAMSUNG SP1614N
> Serial Number:    S016J10XA43633
> Firmware Version: TM100-24
> User Capacity:    160,041,885,696 bytes
> Device is:        In smartctl database [for details use: -P show]
> ATA Version is:   7
> ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 0
> Local Time is:    Tue Jul 11 12:03:42 2006 EDT
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: PASSED
>
> General SMART Values:
> Offline data collection status:  (0x02) Offline data collection activity
>                                       was completed without error.
>                                       Auto Offline Data Collection:
> Disabled.
> Self-test execution status:      (   0) The previous self-test routine
> completed
>                                       without error or no self-test has
> ever
>                                       been run.
> Total time to complete Offline
> data collection:                 (5760) seconds.
> Offline data collection
> capabilities:                    (0x1b) SMART execute Offline immediate.
>                                       Auto Offline data collection on/off
> support.
>                                       Suspend Offline collection upon new
>                                       command.
>                                       Offline surface scan supported.
>                                       Self-test supported.
>                                        No Conveyance Self-test supported.
>                                       No Selective Self-test supported.
> SMART capabilities:            (0x0003) Saves SMART data before entering
>                                       power-saving mode.
>                                       Supports SMART auto save timer.
> Error logging capability:        (0x01) Error logging supported.
>                                       No General Purpose Logging support.
> Short self-test routine
> recommended polling time:        (   1) minutes.
> Extended self-test routine
> recommended polling time:        (  96) minutes.
>
> SMART Attributes Data Structure revision number: 16
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH
> TYPE      UPDATED  WHEN_FAILED RAW_VALUE
> 1 Raw_Read_Error_Rate     0x000b   100   100
> 051    Pre-fail  Always       -       954
> 3 Spin_Up_Time            0x0007   067   050
> 000    Pre-fail  Always       -       5760
> 4 Start_Stop_Count        0x0032   100   100   000    Old_age
> Always       -       76
> 5 Reallocated_Sector_Ct   0x0033   253   253
> 010    Pre-fail  Always       -       0
> 7 Seek_Error_Rate         0x000b   253   253
> 051    Pre-fail  Always       -       0
> 8 Seek_Time_Performance   0x0024   083   083   000    Old_age
> Offline      -       12764
> 9 Power_On_Half_Minutes   0x0032   098   098   000    Old_age
> Always       -       11868h+16m
> 10 Spin_Retry_Count        0x0013   253   253
> 049    Pre-fail  Always       -       0
> 12 Power_Cycle_Count       0x0032   100   100   000    Old_age
> Always       -       42
> 194 Temperature_Celsius     0x0022   139   109   000    Old_age
> Always       -       33
> 195 Hardware_ECC_Recovered  0x000a   100   100   000    Old_age
> Always       -       940776482
> 196 Reallocated_Event_Count 0x0012   098   098   000    Old_age
> Always       -       5
> 197 Current_Pending_Sector  0x0033   253   253
> 010    Pre-fail  Always       -       0
> 198 Offline_Uncorrectable   0x0031   098   098
> 010    Pre-fail  Offline      -       5
> 199 UDMA_CRC_Error_Count    0x000b   100   100
> 051    Pre-fail  Always       -       0
> 200 Multi_Zone_Error_Rate   0x000b   100   100
> 051    Pre-fail  Always       -       0
> 201 Soft_Read_Error_Rate    0x000b   100   100
> 051    Pre-fail  Always       -       0
>
> SMART Error Log Version: 1
> No Errors Logged
>
> SMART Self-test log structure revision number 1
> Num  Test_Description    Status                  Remaining
> LifeTime(hours)  LBA_of_first_error
> # 1  Extended offline    Completed without error       00%     11580
> -
>
> Device does not support Selective Self Tests/Logging
>
> So my question is what do I do to clear out the offline uncorrectable
> sectors, or are there actually problematic sectors?  Without a failed test
> and LBA of the sector I'm sort of at a loss as to figuring out what's going
> on.
>
> Any suggestions would be appreciated!
>
> Thanks,
> -Jim
>