[smartmontools-support] 5 Offline uncorrectable sectors - but no failed self-tests

[Jim T. <em...@ju...>]

Every half hour I get a notification from smartd that my hard drive has 5
offline uncorrectable sectors.

$ tail /var/log/messages
Jul 11 10:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
uncorrectable sectors
ul 11 10:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
uncorrectable sectors
Jul 11 11:11:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
uncorrectable sectors
Jul 11 11:41:07 localhost smartd[3358]: Device: /dev/hda, 5 Offline
uncorrectable sectors

Fearing that the drive was failing, I ran the drive through Samsung's HUTIL
surface scan utility (multiple times) and found no errors.

Then I ran the smartctl offline long test, and though the test reports
"PASSED", I noticed that (in addition to the Offline uncorrectable sectors)
there is a reallocated event count but not a reallocated sector count.

# smartctl -a /dev/hda
smartctl version 5.33 [i386-redhat-linux-gnu] Copyright (C) 2002-4 Bruce
Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG SP1614N
Serial Number:    S016J10XA43633
Firmware Version: TM100-24
User Capacity:    160,041,885,696 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 0
Local Time is:    Tue Jul 11 12:03:42 2006 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02) Offline data collection activity
                                        was completed without error.
                                        Auto Offline Data Collection:
Disabled.
Self-test execution status:      (   0) The previous self-test routine
completed
                                        without error or no self-test has
ever
                                        been run.
Total time to complete Offline
data collection:                 (5760) seconds.
Offline data collection
capabilities:                    (0x1b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off
support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                         No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        No General Purpose Logging support.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        (  96) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH
TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100
051    Pre-fail  Always       -       954
  3 Spin_Up_Time            0x0007   067   050
000    Pre-fail  Always       -       5760
  4 Start_Stop_Count        0x0032   100   100   000    Old_age
Always       -       76
  5 Reallocated_Sector_Ct   0x0033   253   253
010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   253   253
051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0024   083   083   000    Old_age
Offline      -       12764
  9 Power_On_Half_Minutes   0x0032   098   098   000    Old_age
Always       -       11868h+16m
10 Spin_Retry_Count        0x0013   253   253
049    Pre-fail  Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age
Always       -       42
194 Temperature_Celsius     0x0022   139   109   000    Old_age
Always       -       33
195 Hardware_ECC_Recovered  0x000a   100   100   000    Old_age
Always       -       940776482
196 Reallocated_Event_Count 0x0012   098   098   000    Old_age
Always       -       5
197 Current_Pending_Sector  0x0033   253   253
010    Pre-fail  Always       -       0
198 Offline_Uncorrectable   0x0031   098   098
010    Pre-fail  Offline      -       5
199 UDMA_CRC_Error_Count    0x000b   100   100
051    Pre-fail  Always       -       0
200 Multi_Zone_Error_Rate   0x000b   100   100
051    Pre-fail  Always       -       0
201 Soft_Read_Error_Rate    0x000b   100   100
051    Pre-fail  Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining
LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%     11580
-

Device does not support Selective Self Tests/Logging

So my question is what do I do to clear out the offline uncorrectable
sectors, or are there actually problematic sectors?  Without a failed test
and LBA of the sector I'm sort of at a loss as to figuring out what's going
on.

Any suggestions would be appreciated!

Thanks,
-Jim