From: Steffen N. <sne...@ip...> - 2009-02-17 20:11:19
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On Tue, 2009-02-17 at 09:53 -0800, Eric Deutsch wrote: > Notes from today’s call: [...] > - Matt’s suggested adding a few more chromatogram binary data array > types ... > + Pierre-Alain mentions potential overlap with sepML that should be > checked. The proposed "chromatograms" encode some of the internal machine sensor / health (?!) information, i.e. flow rate, pump pressure, gradient composition. IMHO they are valuable in the context of the MS measurement, perhaps as quality control information. > + Would like to get input from Steffen Neumman and Jim Shofstahl On what ? Yours, Steffen |