#5 Usage for a back-reflection setup

[Andreas Sühnel]

Hello,

i am a Material Science student at the technical university Dresden. Currently i am working at an Laue back-reflection setup for an seminar paper and i want to use your LaueTools software to analyze the results. I saw, that there is an angle of 40° between sample and beam in your setup, because you are using a CCD-detector. Whereas in our setup we use a X-Ray film parallel to the sample surface. This film has a hole in the middle where the beam can go thorugh and so the angle between beam and sample ist 90°. With this configuration i wasn't able to fit the experimental spots with the simulated spots like it is described in the chapter "Calibration of 2D Detection Geometry" in the LaueTools Documentation.
Can you tell me please, which parameters i have to change to be able to analyze the Laue-diagrams generated with this back-reflection setup?

Sincerely
Andreas Sühnel