[Fault-injection-developer] RE: FITH test proposal
Status: Alpha
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rustyl
From: Gao, K. <kev...@in...> - 2002-11-14 01:38:46
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For testing we split the new function of FITH into 3 testing aspect:=20 Codesegment support, Old opcode transform to codesegment fault = injection,=20 and some shortcut for writing fsml. =20 We will writes some special faultset to test the codesegment support. That includes, DMA send/receive fault injection, band rates of serier driver fault injection, etc. =20 For old opcode transform, mostly we will use the old test case, We thought if new version of FITH can pass these test, the compability between old and new version is OK. =20 To test the functionality of shortcut, Our test case should contain all the shortcut format which FITH provide. =20 Besides all the above test proposal, we still need test all the = function proveded by FITH, e.g. fith_print. =20 =20 Kevin Gao, SW Engineer, Intel Corporation. Opinions expressed are those of the author and do not represent Intel Corporation =20 Intel China Software Lab.=20 Tel: 021-52574545 ext. 1271 iNet: 8-752-1271=20 =20 -----Original Message----- From: Zhuang, Louis=20 Sent: 2002=C4=EA11=D4=C213=C8=D5 16:17 To: Gao, Kevin; Wang, Frank; Wang, Stanley Cc: 'fau...@li...' Subject: RE: FITH test proposal Could you give us some light about test environment/methods/processes? =20 Louis Zhuang, SW Engineer, Intel Corporation. My opinions are my own and NEVER the opinions of Intel Corporation. =20 -----Original Message----- From: Gao, Kevin=20 Sent: Wednesday, November 13, 2002 4:14 PM To: Zhuang, Louis; Wang, Frank; Wang, Stanley Cc: 'fau...@li...' Subject: FITH test proposal =20 FITH test plan: =20 Inject fault into IO read operation Inject fault into IO write operation Inject fault into MMIO read operation Inject fault into MMIO write operation Inject fault to lost a IRQ operation=20 Inject fault to delay a IRQ operation Inject fault to overload IRQ operation Other attribute testing Inject fault into Sequence IO read operation Inject fault into Sequence IO write operation Inject fault into PCI configuration Inject fault into DMA send operation Inject fault into DMA receive operation =20 Besides using our dummy driver, we will also use seriel driver to test = the functionality of FITH. Our target is to test the compatiblity , and the new functionality of = FITH. =20 =20 Kevin Gao, SW Engineer, Intel Corporation. Opinions expressed are those of the author and do not represent Intel Corporation =20 Intel China Software Lab.=20 Tel: 021-52574545 ext. 1271 iNet: 8-752-1271=20 =20 =20 =20 |