For Software Engineers, DevOps, Data Architects, and IT Leaders
The progression to modern application stacks and microservices architectures has resulted in orders of magnitude more logs, metrics, events, and traces. Like gravity, data attracts more data, making it increasingly difficult to move and process as it accumulates over time. More than ever, there is a need to be able to stream-process, filter, mask, transform, aggregate, analyze, and route that data to various data tier destinations optimized for specific usage.
Testcard is a SDL/SDL_gfx based monitor test pattern (test card) generator. SMPTE and other test patterns are supported. Future plans include a very basic scripting capability to construct custom test patterns from built in primitives.