With Virtual Reflectometer (VR), you can simulate the basic alignment scans of a basic X ray reflectometer (diffractometer) with a Goebel mirror using ray tracing.
With this program, you can characterize reflectometers and get a reflectometer-dependent overillumination correction for X Ray Reflectivity (XRR) scans.
The pogram serves as an educational tool for explaining alignment and for a proper overillumination correction of XRR data. !!Paper will be referenced!!.
VR can be run by code...