Search Results for "electronics"

At present, surface defect equipment based on machine vision has widely replaced artificial visual inspection in various industrial fields, including 3C, automobiles, home appliances, machinery manufacturing, semiconductors and electronics, chemical, pharmaceutical, aerospace, light industry and other industries. Traditional surface defect detection methods based on machine vision often use conventional image processing algorithms or artificially designed features plus classifiers. Generally speaking, imaging schemes are usually designed by using the different properties of the inspected surface or defects. ...