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[Smartmontools-database] Micron_M500_MTFDDAK120MAV
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From: Richard B. (rebowring) <reb...@mi...> - 2013-06-24 21:26:19
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=== START OF INFORMATION SECTION ===
Device Model: Micron_M500_MTFDDAK120MAV
Serial Number: 1309092C9697
LU WWN Device Id: 5 00a075 1092c9697
Firmware Version: MU02
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Jun 07 15:51:16 2013 MDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 555) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O--CK 100 100 --- - 10
5 Reallocated_Sector_Ct -O--CK 100 100 --- - 0
9 Power_On_Hours -O--CK 100 100 --- - 0
12 Power_Cycle_Count -O--CK 100 100 --- - 3
170 Grown_Failing_Block_Ct -O--CK 100 100 --- - 16
171 Reserved_Block_Count -O--CK 100 100 --- - 0
172 Erase_Fail_Count -O--CK 100 100 --- - 0
173 Avg_Block_Erase_Count -O--CK 100 100 --- - 0
174 Unexpect_Power_Loss_Ct -O--CK 100 100 --- - 1
181 Unaligned_Access_Count -O---K 100 100 --- - 0 0 0
183 SATA_Iface_Downshift -O--CK 100 100 --- - 0
184 End-to-End_Error -O--CK 100 100 --- - 0
187 Reported_Uncorrect -O--CK 100 100 --- - 0
188 Command_Timeout -O--CK 100 100 --- - 0
194 Temperature_Celsius -O---K 067 067 --- - 33 (Min/Max 31/33)
195 Hardware_ECC_Recovered -O-RCK 100 100 --- - 122561171
196 Reallocated_Event_Count -O--CK 100 100 --- - 16
197 Current_Pending_Sector -O--CK 100 100 --- - 0
198 Offline_Uncorrectable ----CK 100 100 --- - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0
202 Perc_Rated_Life_Remain P---CK 100 100 --- - 0
206 Write_Error_Rate -OSR-- 100 100 --- - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 255 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 429 Current Device Internal Status Data log
0x25 GPL R/O 145 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 2000 Device vendor specific log
0xa0 SL VS 208 Device vendor specific log
0xa1-0xbf GPL,SL VS 1 Device vendor specific log
0xc0 GPL,SL VS 80 Device vendor specific log
0xc1-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log size 16383 not supported
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 29/33 Celsius
Lifetime Min/Max Temperature: 29/33 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (17)
Index Estimated Time Temperature Celsius
18 2013-06-07 07:54 ? -
... ..(459 skipped). .. -
0 2013-06-07 15:34 ? -
1 2013-06-07 15:35 31 ************
2 2013-06-07 15:36 32 *************
3 2013-06-07 15:37 ? -
4 2013-06-07 15:38 27 ********
5 2013-06-07 15:39 28 *********
6 2013-06-07 15:40 ? -
7 2013-06-07 15:41 29 **********
8 2013-06-07 15:42 30 ***********
... ..( 2 skipped). .. ***********
11 2013-06-07 15:45 30 ***********
12 2013-06-07 15:46 31 ************
13 2013-06-07 15:47 32 *************
... ..( 2 skipped). .. *************
16 2013-06-07 15:50 32 *************
17 2013-06-07 15:51 33 **************
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 3 Lifetime Power-On Resets
1 0x010 4 0 Power-on Hours
1 0x018 6 0 Logical Sectors Written
1 0x020 6 0 Number of Write Commands
1 0x028 6 9 Logical Sectors Read
1 0x030 6 9 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 0 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 33 Current Temperature
5 0x010 1 - Average Short Term Temperature
5 0x018 1 - Average Long Term Temperature
5 0x020 1 33 Highest Temperature
5 0x028 1 27 Lowest Temperature
5 0x030 1 - Highest Average Short Term Temperature
5 0x038 1 - Lowest Average Short Term Temperature
5 0x040 1 - Highest Average Long Term Temperature
5 0x048 1 - Lowest Average Long Term Temperature
5 0x050 4 - Time in Over-Temperature
5 0x058 1 70 Specified Maximum Operating Temperature
5 0x060 4 - Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 0 Number of Hardware Resets
6 0x010 4 0 Number of ASR Events
6 0x018 4 0 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 5~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 2 Device-to-host register FISes sent due to a COMRESET
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