Thanks, the cabling is still in prototype phase so can't do much about ICRC errors.

As the drive ages, the Reallocated_Sector_Count would grow, what is acceptable??
What is the maximum operational temperature which is acceptable??
Are the above to parameters vendor specific??

So if one of these parameters is nearing unacceptable value, only the LONG-test will give the  correct  health of the drive??

Apart from  the above mentioned parameters, is there anything else I should  look for.


And thanks for such quick replies.

On 12/5/06, Bruce Allen <ballen@gravity.phys.uwm.edu > wrote:
The only problem the drive is showing is ICRC (Interface CRC) errors.
This is usually due to faulty cabling or faulty cable connectors.

To weed out bad drives and find problems in advance you must run regular
self-tests:
    smartctl -t long

Cheers,
        Bruce


On Tue, 5 Dec 2006, Saqib bin Sohail wrote:

> Thanks, Fujitsu has some weird way of decoding this attribute
> (reallocated_sector_count) but we have an NDA with them so we will
> eventually find out what is the best way.
>
> The thing I am most interested is in what other parameters can give a hint
> to a failing condition. This drive in particular isn't doing anything useful
> right now but the eventual goal is to predict a failing drive and copy its
> data before it fails.
>
> Thanks
>
>
> On 12/5/06, Bruce Allen < ballen@gravity.phys.uwm.edu> wrote:
>>
>> I think your drive is OK.  The reallocated sector count value looks very
>> high (7D000000000 in base 16) but I think that the leading 7D can be
>> ignored.
>>
>> Phil, do you agree?
>>
>> Cheers,
>>         Bruce
>>
>>
>> On Tue, 5 Dec 2006, Saqib bin Sohail wrote:
>>
>> > Hi Guys
>> >
>> > I would like to know when the health of my drive is going down. From the
>> > archives I have found out that if the Max temperature is beyond certain
>> > threshold and Reallocated_Sector_Count is beyond certain threshold then
>> the
>> > drive should be replaced. Below is the smart report of one of the drives
>> and
>> > I would like to know if there are other attributes which could indicate
>> the
>> > bad health of the drive.
>> >
>> > Thanks
>> >
>> >
>> >
>> > smartctl version 5.37 [x86_64-unknown-linux-gnu] Copyright (C) 2002-6
>> Bruce
>> > Allen
>> > Home page is http://smartmontools.sourceforge.net/
>> >
>> > === START OF INFORMATION SECTION ===
>> > Device Model:     FUJITSU MHV2040BH
>> > Serial Number:    NW96T6425AGY
>> > Firmware Version: 00000029
>> > User Capacity:    40,007,761,920 bytes
>> > Device is:        Not in smartctl database [for details use: -P showall]
>> > ATA Version is:   7
>> > ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 4a
>> > Local Time is:    Tue Dec  5 12:07:45 2006 MST
>> > SMART support is: Available - device has SMART capability.
>> > SMART support is: Enabled
>> >
>> > === START OF READ SMART DATA SECTION ===
>> > SMART overall-health self-assessment test result: PASSED
>> >
>> > General SMART Values:
>> > Offline data collection status:  (0x00) Offline data collection activity
>> >                                       was never started.
>> >                                       Auto Offline Data Collection:
>> > Disabled.
>> > Self-test execution status:      (   0) The previous self-test routine
>> > completed
>> >                                       without error or no self-test has
>> > ever
>> >                                       been run.
>> > Total time to complete Offline
>> > data collection:                 ( 240) seconds.
>> > Offline data collection
>> > capabilities:                    (0x7b) SMART execute Offline immediate.
>> >                                       Auto Offline data collection
>> on/off
>> > support.
>> >                                       Suspend Offline collection upon
>> new
>> >                                       command.
>> >                                       Offline surface scan supported.
>> >                                       Self-test supported.
>> >                                       Conveyance Self-test supported.
>> >                                       Selective Self-test supported.
>> > SMART capabilities:            (0x0003) Saves SMART data before entering
>> >                                       power-saving mode.
>> >                                       Supports SMART auto save timer.
>> > Error logging capability:        (0x01) Error logging supported.
>> >                                       General Purpose Logging supported.
>> > Short self-test routine
>> > recommended polling time:        (   2) minutes.
>> > Extended self-test routine
>> > recommended polling time:        (  28) minutes.
>> > Conveyance self-test routine
>> > recommended polling time:        (   2) minutes.
>> >
>> > SMART Attributes Data Structure revision number: 16
>> > Vendor Specific SMART Attributes with Thresholds:
>> > ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH
>> TYPE      UPDATED
>> > WHEN_FAILED RAW_VALUE
>> > 1 Raw_Read_Error_Rate     0x000f   100   100   046    Pre-fail
>> > Always       -       113258
>> > 2 Throughput_Performance  0x0005   100   100   030    Pre-fail
>> > Offline      -       12058624
>> > 3 Spin_Up_Time            0x0003   100   100   025    Pre-fail
>> > Always       -       1
>> > 4 Start_Stop_Count        0x0032   100   100   000    Old_age
>> > Always       -       165
>> > 5 Reallocated_Sector_Ct   0x0033   100   100   024    Pre-fail
>> > Always       -       8589934592000
>> > 7 Seek_Error_Rate         0x000f   100   100   047    Pre-fail
>> > Always       -       3965
>> > 8 Seek_Time_Performance   0x0005   100   100   019    Pre-fail
>> > Offline      -       0
>> > 9 Power_On_Hours          0x0032   094   094   000    Old_age
>> > Always       -       11667700
>> > 10 Spin_Retry_Count        0x0013   100   100   020    Pre-fail
>> > Always       -       0
>> > 12 Power_Cycle_Count       0x0032   100   100   000    Old_age
>> > Always       -       165
>> > 192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age
>> > Always       -       29
>> > 193 Load_Cycle_Count        0x0032   100   100   000    Old_age
>> > Always       -       1225
>> > 194 Temperature_Celsius     0x0022   100   100   000    Old_age
>> > Always       -       30 (Lifetime Min/Max 20/49)
>> > 195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age
>> > Always       -       850
>> > 196 Reallocated_Event_Count 0x0032   100   100   000    Old_age
>> > Always       -       453967872
>> > 197 Current_Pending_Sector  0x0012   100   100   000    Old_age
>> > Always       -       0
>> > 198 Offline_Uncorrectable   0x0010   100   100   000    Old_age
>> > Offline      -       0
>> > 199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age
>> > Always       -       0
>> > 200 Multi_Zone_Error_Rate   0x000f   100   100   060    Pre-fail
>> > Always       -       0
>> > 203 Run_Out_Cancel          0x0002   100   100   000    Old_age
>> > Always       -       1529030378498
>> > 240 Head_Flying_Hours       0x003e   200   200   000    Old_age
>> > Always       -       0
>> >
>> > SMART Error Log Version: 1
>> > ATA Error Count: 3866 (device log contains only the most recent five
>> errors)
>> >       CR = Command Register [HEX]
>> >       FR = Features Register [HEX]
>> >       SC = Sector Count Register [HEX]
>> >       SN = Sector Number Register [HEX]
>> >       CL = Cylinder Low Register [HEX]
>> >       CH = Cylinder High Register [HEX]
>> >       DH = Device/Head Register [HEX]
>> >       DC = Device Command Register [HEX]
>> >       ER = Error register [HEX]
>> >       ST = Status register [HEX]
>> > Powered_Up_Time is measured from power on, and printed as
>> > DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
>> > SS=sec, and sss=millisec. It "wraps" after 49.710 days.
>> >
>> > Error 3866 occurred at disk power-on lifetime: 2569 hours (107 days + 1
>> > hours)
>> > When the command that caused the error occurred, the device was active
>> or
>> > idle.
>> >
>> > After command completion occurred, registers were:
>> > ER ST SC SN CL CH DH
>> > -- -- -- -- -- -- --
>> > 84 51 60 44 71 55 40  Error: ICRC, ABRT 96 sectors at LBA = 0x00557144 =
>> > 5599556
>> >
>> > Commands leading to the command that caused the error were:
>> > CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>> > -- -- -- -- -- -- -- --  ----------------  --------------------
>> > 25 00 00 a4 6f 55 40 00   1d+04:01:50.324   READ DMA EXT
>> > 25 00 00 54 58 09 40 00   1d+04:01:50.288  READ DMA EXT
>> > 25 00 00 02 da cf 40 00   1d+04:01:50.239  READ DMA EXT
>> > 25 00 00 4e 70 27 40 00   1d+04:01:50.184  READ DMA EXT
>> > 25 00 00 cc 1c 3f 40 00   1d+04:01:50.142  READ DMA EXT
>> >
>> > Error 3865 occurred at disk power-on lifetime: 2441 hours (101 days + 17
>> > hours)
>> > When the command that caused the error occurred, the device was active
>> or
>> > idle.
>> >
>> > After command completion occurred, registers were:
>> > ER ST SC SN CL CH DH
>> > -- -- -- -- -- -- --
>> > 84 51 20 34 7b cd 40  Error: ICRC, ABRT 32 sectors at LBA = 0x00cd7b34 =
>> > 13466420
>> >
>> > Commands leading to the command that caused the error were:
>> > CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>> > -- -- -- -- -- -- -- --  ----------------  --------------------
>> > 25 00 00 54 79 cd 40 00  11d+11:50:33.694  READ DMA EXT
>> > 25 00 00 30 da 24 40 00  11d+11:50:33.657  READ DMA EXT
>> > 25 00 00 5c 15 fb 40 00  11d+11:50:33.613  READ DMA EXT
>> > 25 00 00 52 38 2c 40 00  11d+11:50:33.568  READ DMA EXT
>> > 25 00 00 fc 4a b7 40 00  11d+11:50:33.534  READ DMA EXT
>> >
>> > Error 3864 occurred at disk power-on lifetime: 2387 hours (99 days + 11
>> > hours)
>> > When the command that caused the error occurred, the device was active
>> or
>> > idle.
>> >
>> > After command completion occurred, registers were:
>> > ER ST SC SN CL CH DH
>> > -- -- -- -- -- -- --
>> > 84 51 10 69 91 05 40  Error: ICRC, ABRT 16 sectors at LBA = 0x00059169 =
>> > 364905
>> >
>> > Commands leading to the command that caused the error were:
>> > CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>> > -- -- -- -- -- -- -- --  ----------------  --------------------
>> > 25 00 00 79 8f 05 40 00   9d+05:52:17.716   READ DMA EXT
>> > 25 00 00 35 aa 6c 40 00   9d+05:52:17.662  READ DMA EXT
>> > 25 00 00 d4 ea 08 40 00   9d+05:52:17.636  READ DMA EXT
>> > 25 00 00 c2 43 c4 40 00   9d+05:52:17.606  READ DMA EXT
>> > 25 00 00 b7 2e 05 40 00   9d+05:52:17.568  READ DMA EXT
>> >
>> > Error 3863 occurred at disk power-on lifetime: 2367 hours (98 days + 15
>> > hours)
>> > When the command that caused the error occurred, the device was active
>> or
>> > idle.
>> >
>> > After command completion occurred, registers were:
>> > ER ST SC SN CL CH DH
>> > -- -- -- -- -- -- --
>> > 84 51 50 09 ae 86 40  Error: ICRC, ABRT 80 sectors at LBA = 0x0086ae09 =
>> > 8826377
>> >
>> > Commands leading to the command that caused the error were:
>> > CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>> > -- -- -- -- -- -- -- --  ----------------  --------------------
>> > 25 00 00 59 ad 86 40 00   8d+10:12:50.647  READ DMA EXT
>> > 25 00 00 1c 1f 2c 40 00   8d+10:12:50.597  READ DMA EXT
>> > 25 00 00 e0 6b 34 40 00   8d+10:12:50.547  READ DMA EXT
>> > 25 00 00 e4 30 2f 40 00   8d+10:12:50.519  READ DMA EXT
>> > 25 00 00 3c 51 fc 40 00   8d+10:12:50.486  READ DMA EXT
>> >
>> > Error 3862 occurred at disk power-on lifetime: 2367 hours (98 days + 15
>> > hours)
>> > When the command that caused the error occurred, the device was active
>> or
>> > idle.
>> >
>> > After command completion occurred, registers were:
>> > ER ST SC SN CL CH DH
>> > -- -- -- -- -- -- --
>> > 84 51 50 72 ff 81 40  Error: ICRC, ABRT 80 sectors at LBA = 0x0081ff72 =
>> > 8519538
>> >
>> > Commands leading to the command that caused the error were:
>> > CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
>> > -- -- -- -- -- -- -- --  ----------------  --------------------
>> > 25 00 00 c2 fe 81 40 00   8d+09:15:31.070   READ DMA EXT
>> > 25 00 00 a2 1a 2c 40 00   8d+09:15:31.027  READ DMA EXT
>> > 25 00 00 e8 67 21 40 00   8d+09:15:30.987  READ DMA EXT
>> > 25 00 00 eb d2 2f 40 00   8d+09:15:30.945  READ DMA EXT
>> > 25 00 00 28 d9 18 40 00   8d+09:15:30.915  READ DMA EXT
>> >
>> > SMART Self-test log structure revision number 1
>> > No self-tests have been logged.  [To run self-tests, use: smartctl -t]
>> >
>> >
>> > SMART Selective self-test log data structure revision number 1
>> > SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
>> >   1        0        0  Not_testing
>> >   2        0        0  Not_testing
>> >   3        0        0  Not_testing
>> >   4        0        0  Not_testing
>> >   5        0        0  Not_testing
>> > Selective self-test flags (0x0):
>> > After scanning selected spans, do NOT read-scan remainder of disk.
>> > If Selective self-test is pending on power-up, resume after 0 minute
>> delay.
>> >
>> >
>> >
>>
>
>
>
>



--
Saqib bin Sohail
PhD ECE
University of Colorado at Boulder
(303) 786 0636
http://ucsu.colorado.edu/~sohail/index.html