Hi Guys

I would like to know when the health of my drive is going down. From the archives I have found out that if the Max temperature is beyond certain threshold and Reallocated_Sector_Count is beyond certain threshold then the drive should be replaced. Below is the smart report of one of the drives and I would like to know if there are other attributes which could indicate the bad health of the drive.

Thanks



smartctl version 5.37 [x86_64-unknown-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     FUJITSU MHV2040BH
Serial Number:    NW96T6425AGY
Firmware Version: 00000029
User Capacity:    40,007,761,920 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 4a
Local Time is:    Tue Dec  5 12:07:45 2006 MST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                 ( 240) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  28) minutes.
Conveyance self-test routine
recommended polling time:        (   2) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   046    Pre-fail  Always       -       113258
  2 Throughput_Performance  0x0005   100   100   030    Pre-fail  Offline      -       12058624
  3 Spin_Up_Time            0x0003   100   100   025    Pre-fail  Always       -       1
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       165
  5 Reallocated_Sector_Ct   0x0033   100   100   024    Pre-fail  Always       -       8589934592000
  7 Seek_Error_Rate         0x000f   100   100   047    Pre-fail  Always       -       3965
  8 Seek_Time_Performance   0x0005   100   100   019    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   094   094   000    Old_age   Always       -       11667700
 10 Spin_Retry_Count        0x0013   100   100   020    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       165
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       29
193 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       1225
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       30 (Lifetime Min/Max 20/49)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       850
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       453967872
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000f   100   100   060    Pre-fail  Always       -       0
203 Run_Out_Cancel          0x0002   100   100   000    Old_age   Always       -       1529030378498
240 Head_Flying_Hours       0x003e   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 3866 (device log contains only the most recent five errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 3866 occurred at disk power-on lifetime: 2569 hours (107 days + 1 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 60 44 71 55 40  Error: ICRC, ABRT 96 sectors at LBA = 0x00557144 = 5599556

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 a4 6f 55 40 00   1d+04:01:50.324  READ DMA EXT
  25 00 00 54 58 09 40 00   1d+04:01:50.288  READ DMA EXT
  25 00 00 02 da cf 40 00   1d+04:01: 50.239  READ DMA EXT
  25 00 00 4e 70 27 40 00   1d+04:01:50.184  READ DMA EXT
  25 00 00 cc 1c 3f 40 00   1d+04:01:50.142  READ DMA EXT

Error 3865 occurred at disk power-on lifetime: 2441 hours (101 days + 17 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 20 34 7b cd 40  Error: ICRC, ABRT 32 sectors at LBA = 0x00cd7b34 = 13466420

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 54 79 cd 40 00  11d+11:50: 33.694  READ DMA EXT
  25 00 00 30 da 24 40 00  11d+11:50:33.657  READ DMA EXT
  25 00 00 5c 15 fb 40 00  11d+11:50:33.613  READ DMA EXT
  25 00 00 52 38 2c 40 00  11d+11:50:33.568  READ DMA EXT
  25 00 00 fc 4a b7 40 00  11d+11:50: 33.534  READ DMA EXT

Error 3864 occurred at disk power-on lifetime: 2387 hours (99 days + 11 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 10 69 91 05 40  Error: ICRC, ABRT 16 sectors at LBA = 0x00059169 = 364905

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 79 8f 05 40 00   9d+05:52:17.716  READ DMA EXT
  25 00 00 35 aa 6c 40 00   9d+05:52:17.662  READ DMA EXT
  25 00 00 d4 ea 08 40 00   9d+05:52: 17.636  READ DMA EXT
  25 00 00 c2 43 c4 40 00   9d+05:52:17.606  READ DMA EXT
  25 00 00 b7 2e 05 40 00   9d+05:52:17.568  READ DMA EXT

Error 3863 occurred at disk power-on lifetime: 2367 hours (98 days + 15 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 50 09 ae 86 40  Error: ICRC, ABRT 80 sectors at LBA = 0x0086ae09 = 8826377

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 59 ad 86 40 00   8d+10:12: 50.647  READ DMA EXT
  25 00 00 1c 1f 2c 40 00   8d+10:12:50.597  READ DMA EXT
  25 00 00 e0 6b 34 40 00   8d+10:12:50.547  READ DMA EXT
  25 00 00 e4 30 2f 40 00   8d+10:12:50.519  READ DMA EXT
  25 00 00 3c 51 fc 40 00   8d+10:12: 50.486  READ DMA EXT

Error 3862 occurred at disk power-on lifetime: 2367 hours (98 days + 15 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 50 72 ff 81 40  Error: ICRC, ABRT 80 sectors at LBA = 0x0081ff72 = 8519538

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 c2 fe 81 40 00   8d+09:15:31.070  READ DMA EXT
  25 00 00 a2 1a 2c 40 00   8d+09:15:31.027  READ DMA EXT
  25 00 00 e8 67 21 40 00   8d+09:15: 30.987  READ DMA EXT
  25 00 00 eb d2 2f 40 00   8d+09:15:30.945  READ DMA EXT
  25 00 00 28 d9 18 40 00   8d+09:15:30.915  READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


--
Saqib bin Sohail
University of Colorado at Boulder
(303) 786 0636
http://ucsu.colorado.edu/~sohail/index.html