C:\Program Files (x86)\smartmontools\bin>smartctl -t short f:
smartctl 5.42 2011-10-20 r3458 [i686-w64-mingw32-win7(64)] (sf-win32-5.42-1)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Sending command: "Execute SMART Short self-test routine immediately in off-line mode".
Drive command "Execute SMART Short self-test routine immediately in off-line mode" successful.
Testing has begun.
Please wait 1 minutes for test to complete.
Test will complete after Fri Mar 23 03:38:08 2012

Use smartctl -X to abort test.

C:\Program Files (x86)\smartmontools\bin>smartctl -a f:
smartctl 5.42 2011-10-20 r3458 [i686-w64-mingw32-win7(64)] (sf-win32-5.42-1)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDS721010DLE630
Serial Number: MSE5215V07UZ2E
LU WWN Device Id: 5 000cca 37cc39016
Firmware Version: MS2OA5Q0
User Capacity: 1.000.204.886.016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri Mar 23 03:40:28 2012 ESAST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 8235) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 138) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 098 098 016 Pre-fail Always - 5
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 90
3 Spin_Up_Time 0x0007 127 127 024 Pre-fail Always - 180 (Average
182)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 47
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 113 113 020 Pre-fail Offline - 35
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 76
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 13
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 47
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 47
194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Min/Max 2
4/47)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 12 hours (0 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 e0 20 b0 a3 00 Error: UNC 224 sectors at LBA = 0x00a3b020 = 10727456

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 00 b0 a3 e0 00 02:46:29.737 READ DMA EXT
25 00 00 00 af a3 e0 00 02:46:29.727 READ DMA EXT
25 00 00 00 ae a3 e0 00 02:46:29.727 READ DMA EXT
25 00 00 00 ad a3 e0 00 02:46:29.726 READ DMA EXT
25 00 00 00 ac a3 e0 00 02:46:29.726 READ DMA EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 76 -
# 2 Short offline Completed without error 00% 25 -
# 3 Short offline Completed without error 00% 24 -
# 4 Short offline Completed without error 00% 0 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.