Here are a few links:
http://www.hardwaresecrets.com/article/29
http://en.wikipedia.org/wiki/Badblocks
http://smartmontools.sourceforge.net/badblockhowto.html
On Mon, 14 Apr 2008, Ooi Kwan Chen wrote:
>
> Hi Bruce,
>
> There are 4 read failures are detected during the long test. Below is the result of '-a' input
>
> smartctl -a /dev/hda
> smartctl version 5.36 [x86_64-unknown-linux-gnu] Copyright (C) 2002-6 Bruce Allen
> Home page is http://smartmontools.sourceforge.net/
>
> === START OF INFORMATION SECTION ===
> Device Model: SAMSUNG SP1604N
> Serial Number: S013J20Y428048
> Firmware Version: TM100-30
> User Capacity: 160,041,885,696 bytes
> Device is: In smartctl database [for details use: -P show]
> ATA Version is: 7
> ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
> Local Time is: Mon Apr 14 14:08:43 2008 PHT
> SMART support is: Available - device has SMART capability.
> SMART support is: Enabled
>
> === START OF READ SMART DATA SECTION ===
> SMART overall-health self-assessment test result: PASSED
>
> General SMART Values:
> Offline data collection status: (0x82) Offline data collection activity
> was completed without error.
> Auto Offline Data Collection: Enabled.
> Self-test execution status: ( 112) The previous self-test completed having
> the read element of the test failed.
> Total time to complete Offline
> data collection: (6000) seconds.
> Offline data collection
> capabilities: (0x1b) SMART execute Offline immediate.
> Auto Offline data collection on/off support.
> Suspend Offline collection upon new
> command.
> Offline surface scan supported.
> Self-test supported.
> No Conveyance Self-test supported.
> No Selective Self-test supported.
> SMART capabilities: (0x0003) Saves SMART data before entering
> power-saving mode.
> Supports SMART auto save timer.
> Error logging capability: (0x01) Error logging supported.
> No General Purpose Logging support.
> Short self-test routine
> recommended polling time: ( 1) minutes.
> Extended self-test routine
> recommended polling time: ( 100) minutes.
>
> SMART Attributes Data Structure revision number: 16
> Vendor Specific SMART Attributes with Thresholds:
> ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
> 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 18
> 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5760
> 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 103
> 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0
> 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
> 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0
> 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age Always - 11929h+36m
> 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
> 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
> 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 79
> 194 Temperature_Celsius 0x0022 148 091 000 Old_age Always - 30
> 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 118730715
> 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1
> 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
> 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 1
> 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
> 200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0
> 201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age Always - 0
>
> SMART Error Log Version: 1
> No Errors Logged
>
> SMART Self-test log structure revision number 1
> Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
> # 1 Extended offline Completed: read failure 00% 11928 316006495
> # 2 Short offline Completed without error 00% 9998 -
> # 3 Short offline Completed without error 00% 9976 -
> # 4 Extended offline Completed: read failure 00% 9944 316006495
> # 5 Short offline Completed without error 00% 9942 -
> # 6 Short offline Completed without error 00% 9920 -
> # 7 Short offline Completed without error 00% 9898 -
> # 8 Short offline Completed without error 00% 9875 -
> # 9 Short offline Completed without error 00% 9853 -
> #10 Short offline Completed without error 00% 9830 -
> #11 Short offline Completed without error 00% 9808 -
> #12 Extended offline Completed: read failure 00% 9787 316006495
> #13 Short offline Completed without error 00% 9786 -
> #14 Short offline Completed without error 00% 9763 -
> #15 Short offline Completed without error 00% 9741 -
> #16 Short offline Completed without error 00% 9718 -
> #17 Short offline Completed without error 00% 9696 -
> #18 Short offline Completed without error 00% 9673 -
> #19 Short offline Completed without error 00% 9651 -
> #20 Extended offline Completed: read failure 00% 9630 316006495
> #21 Short offline Completed without error 00% 9628 -
>
> Device does not support Selective Self Tests/Logging
>
>
> Hope this helps. Appreciate your kind advice
>
> Thank you for your attention
>
> - J o h N ? -
>
>
>> Date: Sat, 12 Apr 2008 08:50:14 -0500
>> From: ballen@...
>> To: neothe11@...
>> CC: smartmontools-support@...
>> Subject: Re: [smartmontools-support] Another SMARTD Error Messages
>>
>>> I have this SMARTD error message from my hard disk in my server
>>>
>>> SMART Error (OfflineUncorrectableSector) detected
>>>
>>> smartctl version 5.36 [x86_64-unknown-linux-gnu] Copyright (C) 2002-6 Bruce AllenHome page is http://smartmontools.sourceforge.net/
>>> === START OF INFORMATION SECTION ===Device Model: SAMSUNG SP1604NSerial Number: S013J20Y428048Firmware Version: TM100-30User Capacity: 160,041,885,696 bytesDevice is: In smartctl database [for details use: -P show]ATA Version is: 7ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0Local Time is: Fri Apr 11 11:36:49 2008 PHTSMART support is: Available - device has SMART capability.SMART support is: Enabled
>>> === START OF READ SMART DATA SECTION ===SMART overall-health self-assessment test result: PASSED
>>> General SMART Values:Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled.Self-test execution status: ( 249) Self-test routine in progress... 90% of test remaining.Total time to complete Offlinedata collection: (6000) seconds.Offline data collectioncapabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off supp ort. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. !
>> No Selective Self-test supported.SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer.Error logging capability: (0x01) Error logging supported. No General Purpose Logging support.Short self-test routinerecommended polling time: ( 1) minutes.Extended self-test routinerecommended polling time: ( 100) minutes.
>>> SMART Attributes Data Structure revision number: 16Vendor Specific SMART Attributes with Thresholds:ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5760 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 103 5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0 9 Power_On_Half_Minutes 0x0032 098 098 000 Old_age Always - 11860h+14m 10 Spin_Retry_Count !
>> 0x0033 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 79194 Temperature_Celsius 0x0022 151 091 000 Old_age Always - 29195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 224991196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 1199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_a!
>> ge Always - 0201 Soft_Read_Erro!
>> r_Rate
>> 0x000a 100 100 051 Old_age Always - 0
>>> SMART Error Log Version: 1No Errors Logged
>>> SMART Self-test log structure revision number 1Num Test_Description Status Remaining LifeTime(hours) LBA _of_first_error# 1 Short offline Completed without error 00% 9998 -# 2 Short offline Completed without error 00% 9976 -# 3 Extended offline Completed: read failure 00% 9944 316 006495# 4 Short offline Completed without error 00% 9942 -# 5 Short offline Completed without error 00% 9920 -# 6 Short offline Completed without error 00% 9898 -# 7 Short offline Completed without error 00% 9875 -# 8 Short offline Completed without error 00% 9853 -# 9 Short offline Completed without error 00% 9830 -#10 Short offline Completed without error 00% 9808 -#11 Extended offline !
>> Completed: read failure 00% 9787 316 006495#12 Short offline Completed without error 00% 9786 -#13 Short offline Completed without error 00% 9763 -#14 Short offline Completed without error 00% 9741 -#15 Short offline Completed without error 00% 9718 -#16 Short offline Completed without error 00% 9696 -#17 Short offline Completed without error 00% 9673 -#18 Short offline Completed without error 00% 9651 -#19 Extended offline Completed: read failure 00% 9630 316 006495#20 Short offline Completed without error 00% 9628 -#21 Short offline Completed without error 00% 9606 -
>>> Device does not support Selective Self Tests/Logging
>>> The error message have been generated from time to time. But when I type smartctl -H /dev/hda, the result is below
>>>
>>> === START OF READ SMART DATA SECTION ===SMART overall-health self-assessment test result: PASSED
>>> Can anyone please tell me whether my hard disk is still working well?
>>
>> Run an extended self test '-t long' and see if any of the disk sectors are
>> not readable. You will have to wait an couple of hours for the self-test
>> to complete, then look at the output with '-a'.
>>
>> Cheers,
>> Bruce
>
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